• DocumentCode
    626904
  • Title

    Time domain probe insertion to find steady state of strongly nonlinear high-Q oscillators

  • Author

    Bizzarri, Frederico ; Brambilla, Angelo ; Gruosso, G. ; Gajani, Giancarlo Storti

  • Author_Institution
    Dipt. di Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy
  • fYear
    2013
  • fDate
    19-23 May 2013
  • Firstpage
    1865
  • Lastpage
    1868
  • Abstract
    Probe insertion is traditionally used in the frequency domain to increase robustness of the harmonic balance method and avoid the DC degenerate solution. This technique evidences several good properties, for instance when simulating oscillators that are based on high quality factor resonators or AC coupled ones. In this paper the probe insertion technique is extended to the time domain, allowing the application of the shooting method to a wider class of circuits including for example crystal oscillators. Time domain methods, such as shooting, are superior in the simulation of strongly nonlinear, and, thanks to a recent extention, mixed analog/digital circuits. Moreover, time domain probe insertion can be used to find multiple steady state solutions and check their stability properties, without the need to compute the eigenvalues of the monodromy matrix.
  • Keywords
    Q-factor; circuit simulation; circuit stability; crystal oscillators; eigenvalues and eigenfunctions; frequency-domain analysis; probes; time-domain analysis; AC coupling; DC degenerate solution; crystal oscillator; eigenvalue; frequency domain analysis; harmonic balance method; mixed analog-digital circuit; monodromy matrix; multiple steady state solution; nonlinear high-Q oscillator; quality factor resonator; stability property; time domain probe insertion technique; Integrated circuit modeling; Limit-cycles; Oscillators; Probes; Stability analysis; Steady-state; Time-domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
  • Conference_Location
    Beijing
  • ISSN
    0271-4302
  • Print_ISBN
    978-1-4673-5760-9
  • Type

    conf

  • DOI
    10.1109/ISCAS.2013.6572229
  • Filename
    6572229