DocumentCode
626966
Title
Dual-threshold-voltage configurable circuits with three-independent-gate silicon nanowire FETs
Author
Jian Zhang ; Gaillardon, Pierre-Emmanuel ; De Micheli, G.
Author_Institution
Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
fYear
2013
fDate
19-23 May 2013
Firstpage
2111
Lastpage
2114
Abstract
We extend ambipolar silicon nanowire transistors by using three independent gates and show an efficient approach to implement dual-threshold-voltage configurable circuits. Polarity and threshold voltage of uncommitted devices are determined by applying different bias patterns to the three gates. Uncommitted logic gates can thus be configured to implement different logic functions for dual-threshold-voltage design using a wiring scheme, to target either high-performance or low-leakage applications. Synthesis of benchmark circuits with these devices shows comparable performance and 54% reduction of leakage power consumption compared to low-standby-power FinFET technology.
Keywords
bipolar transistors; elemental semiconductors; logic gates; nanowires; silicon; Si; ambipolar nanowire transistors; benchmark circuits; bias patterns; dual-threshold-voltage configurable circuits; dual-threshold-voltage design; high-performance applications; independent gates; leakage power consumption; logic functions; low-leakage applications; low-standby-power FinFET technology; polarity voltage; three-independent-gate nanowire FET; uncommitted logic gates; wiring scheme; Delays; FinFETs; Integrated circuit modeling; Logic gates; Performance evaluation; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
Conference_Location
Beijing
ISSN
0271-4302
Print_ISBN
978-1-4673-5760-9
Type
conf
DOI
10.1109/ISCAS.2013.6572291
Filename
6572291
Link To Document