• DocumentCode
    626966
  • Title

    Dual-threshold-voltage configurable circuits with three-independent-gate silicon nanowire FETs

  • Author

    Jian Zhang ; Gaillardon, Pierre-Emmanuel ; De Micheli, G.

  • Author_Institution
    Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
  • fYear
    2013
  • fDate
    19-23 May 2013
  • Firstpage
    2111
  • Lastpage
    2114
  • Abstract
    We extend ambipolar silicon nanowire transistors by using three independent gates and show an efficient approach to implement dual-threshold-voltage configurable circuits. Polarity and threshold voltage of uncommitted devices are determined by applying different bias patterns to the three gates. Uncommitted logic gates can thus be configured to implement different logic functions for dual-threshold-voltage design using a wiring scheme, to target either high-performance or low-leakage applications. Synthesis of benchmark circuits with these devices shows comparable performance and 54% reduction of leakage power consumption compared to low-standby-power FinFET technology.
  • Keywords
    bipolar transistors; elemental semiconductors; logic gates; nanowires; silicon; Si; ambipolar nanowire transistors; benchmark circuits; bias patterns; dual-threshold-voltage configurable circuits; dual-threshold-voltage design; high-performance applications; independent gates; leakage power consumption; logic functions; low-leakage applications; low-standby-power FinFET technology; polarity voltage; three-independent-gate nanowire FET; uncommitted logic gates; wiring scheme; Delays; FinFETs; Integrated circuit modeling; Logic gates; Performance evaluation; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
  • Conference_Location
    Beijing
  • ISSN
    0271-4302
  • Print_ISBN
    978-1-4673-5760-9
  • Type

    conf

  • DOI
    10.1109/ISCAS.2013.6572291
  • Filename
    6572291