DocumentCode :
626966
Title :
Dual-threshold-voltage configurable circuits with three-independent-gate silicon nanowire FETs
Author :
Jian Zhang ; Gaillardon, Pierre-Emmanuel ; De Micheli, G.
Author_Institution :
Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
fYear :
2013
fDate :
19-23 May 2013
Firstpage :
2111
Lastpage :
2114
Abstract :
We extend ambipolar silicon nanowire transistors by using three independent gates and show an efficient approach to implement dual-threshold-voltage configurable circuits. Polarity and threshold voltage of uncommitted devices are determined by applying different bias patterns to the three gates. Uncommitted logic gates can thus be configured to implement different logic functions for dual-threshold-voltage design using a wiring scheme, to target either high-performance or low-leakage applications. Synthesis of benchmark circuits with these devices shows comparable performance and 54% reduction of leakage power consumption compared to low-standby-power FinFET technology.
Keywords :
bipolar transistors; elemental semiconductors; logic gates; nanowires; silicon; Si; ambipolar nanowire transistors; benchmark circuits; bias patterns; dual-threshold-voltage configurable circuits; dual-threshold-voltage design; high-performance applications; independent gates; leakage power consumption; logic functions; low-leakage applications; low-standby-power FinFET technology; polarity voltage; three-independent-gate nanowire FET; uncommitted logic gates; wiring scheme; Delays; FinFETs; Integrated circuit modeling; Logic gates; Performance evaluation; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
Conference_Location :
Beijing
ISSN :
0271-4302
Print_ISBN :
978-1-4673-5760-9
Type :
conf
DOI :
10.1109/ISCAS.2013.6572291
Filename :
6572291
Link To Document :
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