Title :
Preprocessing technique for accelerating reconfiguration of degradable VLSI arrays
Author :
Yuanbo Zhu ; Jigang Wu ; Siew-Kei Lam ; Srikanthan, Thambipillai
Author_Institution :
Sch. of Comput. Sci. & Software Eng., Tianjin Polytech. Univ., Tianjin, China
Abstract :
This paper presents a heuristic approach to accelerate the reconfiguration of two-dimensional degradable VLSI arrays linked by 4-port switches in presence of faulty processing elements (PEs). In particular, we proposed a technique to preprocess the host array by 1) identifying fault-free PEs that cannot form the target array due to their proximity to faulty PEs, and 2) labeling these fault-free PEs as faults. The proposed preprocessing method minimizes the number of PEs that will be considered for reconfiguration, thus accelerating the reconfiguration process. Simulation results show that the runtime of two well-known algorithms are significantly reduced by employing the preprocessing technique. In addition, we demonstrate the scalability of the proposed technique by showing that the runtime reduction rate increases with increasing fault density.
Keywords :
VLSI; switches; 4-port switches; fault density; fault-free PE identification; faulty PE; faulty processing element; heuristic approach; host array; preprocessing technique; reconfiguration process acceleration; runtime reduction rate; target array; two-dimensional degradable VLSI arrays; Algorithm design and analysis; Arrays; Fault diagnosis; Fault tolerance; Fault tolerant systems; Runtime; Very large scale integration;
Conference_Titel :
Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4673-5760-9
DOI :
10.1109/ISCAS.2013.6572368