DocumentCode :
627121
Title :
Cross-scene abnormal event detection
Author :
Tzu-Yi Hung ; Jiwen Lu ; Yap-Peng Tan
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2013
fDate :
19-23 May 2013
Firstpage :
2844
Lastpage :
2847
Abstract :
This paper presents an cross-scene abnormal event detection method by adopting Bag of Words (BoW) model with Spatial Pyramid Matching Kernel (SPM) cooperating with SIFT features and a SVM classifier. Different from existing abnormal event detection methods where abnormal events happened in a well-learned scene are considered and detected, we aim to detect concerned events in public where scenes can be unlearned before. Our method is motivated by the fact that the pattern of the notable events are similar and the learned models should be transferable to examine the events in other unlearned public scenes. To learn the patterns for an abnormal event, we divide the proposed method into two steps: feature coding and spatial pooling. For the feature coding step, the codebook is generated and the feature is quantized based on small patches. For the spatial pooling step, the patches are concatenating to exploit the spatial information of local regions. The intersection kernel is used to integrate with a SVM classifier. Experimental results on two benchmark databases demonstrate the efficacy of our proposed approach.
Keywords :
signal detection; support vector machines; SIFT features; SVM classifier; bag of words model; cross-scene abnormal event detection; feature coding; spatial pooling; spatial pyramid matching kernel; unlearned public scenes; Databases; Educational institutions; Event detection; Feature extraction; Kernel; Support vector machines; Training;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
Conference_Location :
Beijing
ISSN :
0271-4302
Print_ISBN :
978-1-4673-5760-9
Type :
conf
DOI :
10.1109/ISCAS.2013.6572471
Filename :
6572471
Link To Document :
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