• DocumentCode
    627151
  • Title

    A study on MOSFET rectifiers maximum output voltage for RF power harvesting circuits

  • Author

    Goncalves, Hugo ; Fernandes, J. ; Martins, Miguel

  • Author_Institution
    Inst. Super. Tecnico, Tech. Univ. Lisbon, Lisbon, Portugal
  • fYear
    2013
  • fDate
    19-23 May 2013
  • Firstpage
    2964
  • Lastpage
    2967
  • Abstract
    Radio Frequency (RF) energy harvesting circuits have to harvest energy from very weak sources demanding high sensitivity and high efficiency. In this paper it is presented a study on rectifiers used in RF energy harvesting systems with MOSFET transistors operating in weak-inversion region, where both charge and discharge currents have the same order of magnitude. The study proves that the maximum output voltage of a MOSFET rectifier for very low input voltage is dependent in the first order to the relation between the signal amplitude and thermal voltage (VT). It is presented a method to calculate the maximum theoretical output voltage in two circuit topologies for input voltages of 10mV, 50mV and 100mV. The circuits are studied for 130nm, 90nm and 45nm CMOS technologies, proving the hypothesized theory that the maximum theoretical output voltage is not a function of the normal transistor parameters (i.e. Vt0, W/L) but instead, the relation between the input voltage amplitude and VT.
  • Keywords
    CMOS integrated circuits; MOSFET; energy harvesting; low-power electronics; radiofrequency integrated circuits; rectifying circuits; MOSFET rectifier; maximum output voltage; radio frequency power harvesting circuits; signal amplitude; size 130 nm; size 45 nm; size 90 nm; thermal voltage; transistor parameters; voltage 10 mV; voltage 100 mV; voltage 50 mV; weak-inversion region; CMOS integrated circuits; Capacitors; Energy harvesting; Logic gates; MOSFET; Radio frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
  • Conference_Location
    Beijing
  • ISSN
    0271-4302
  • Print_ISBN
    978-1-4673-5760-9
  • Type

    conf

  • DOI
    10.1109/ISCAS.2013.6572501
  • Filename
    6572501