DocumentCode :
627658
Title :
SOC estimation for aged lithium-ion batteries using model adaptive extended Kalman filter
Author :
Sepasi, Saeed ; Ghorbani, Reza ; Bor Yann Liaw
Author_Institution :
Univ. of Hawaii at Manoa, Honolulu, HI, USA
fYear :
2013
fDate :
16-19 June 2013
Firstpage :
1
Lastpage :
6
Abstract :
Rechargeable batteries as an energy source in electric vehicles (EVs), hybrid electric vehicles (HEVs) and smart grids are receiving more attention with the worldwide demand for reduction of greenhouse gas emission. In all of these applications for secondary batteries, the battery management system (BMS) needs to have an accurate inline estimation of state of charge (SOC) of each individual cell in the battery pack. Yet, this estimation is still difficult, especially after substantial aging of batteries. This paper presents a model adaptive extended Kalman filter (MAEKF) method to estimate SOC of Li-ion batteries. This method uses an optimization algorithm to update the EKF model parameters during a discharge period. State of health (SOH) information would be updated while the battery is charged/discharged, (aged). The effectiveness of the proposed method has been verified based on data acquired from a LiFePO4 battery.
Keywords :
Kalman filters; battery management systems; electric charge; hybrid electric vehicles; lithium; optimisation; secondary cells; smart power grids; state estimation; BMS; HEV; Li-ion batteries; MAEKF method; SOC; SOH information; battery management system; battery pack; hybrid electric vehicles; inline estimation; model adaptive extended Kalman filter; optimization algorithm; rechargeable batteries; secondary batteries; smart grids; state of charge; state of health; Adaptation models; Aging; Batteries; Integrated circuit modeling; Mathematical model; System-on-chip; Voltage measurement; EV; HEV; LiFePO4; SOC; SOH; aged cell; battery management system; extended Kalman filter; smart grid;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transportation Electrification Conference and Expo (ITEC), 2013 IEEE
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4799-0146-3
Type :
conf
DOI :
10.1109/ITEC.2013.6573479
Filename :
6573479
Link To Document :
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