Design of an embedded RF signal generator for BIST application

Author

Lahbib, I. ; Doukkali, Mohamed-Aziz ; Descarnps, Philippe ; Kelma, C. ; Tesson, O.

fYear

2013

fDate

16-19 June 2013

Firstpage

1

Lastpage

4

Abstract

This paper presents the design of an RF test signal generator for a Built-In-Self-Test (BIST) application. This embedded generator is the most sensitive part of a new BIST architecture which basically, consists of integrating an RF generator at the RF Front End input and an RMS detector at the IF side on chip at lowest cost. The proposed BIST cell targets a direct low cost measurement of the gain and the input 1dB compression point (CP1) of a K-band satellite reception chain (18.2 GHz - 22 GHz). The BIST generator, designed in a BiCMOS process, consumes 10 mA. Its power range is equal to 17 dB [-45 dBm; -28 dBm] and its frequency varies from 17.5 GHz to 23.1 GHz. This BIST circuit provides new perspectives in terms of production test strategy, cost reduction and measurement accuracy for mm-wave integrated circuits.

Keywords

built-in self test; design engineering; signal generators; BIST application; BIST architecture; BIST cell; BIST generator; BiCMOS process; IF side; K-band satellite reception chain; RF front end input; RF test signal generator; RMS detector; built in self test application; compression point; cost reduction; embedded RF signal generator; embedded generator; measurement accuracy; mm-wave integrated circuit; production test strategy; Built-in self-test; Frequency measurement; Gain; Gain measurement; Generators; Oscillators; Radio frequency;

fLanguage

English

Publisher

ieee

Conference_Titel

New Circuits and Systems Conference (NEWCAS), 2013 IEEE 11th International

Conference_Location

Paris

Print_ISBN

978-1-4799-0618-5

Type

conf

DOI

10.1109/NEWCAS.2013.6573661

Filename

6573661