Title :
A practical characterization of a NASA SpaceCube application through fault emulation and laser testing
Author :
Walters, John Paul ; Zick, Kenneth M. ; French, Mark
Author_Institution :
Inf. Sci. Inst., Univ. of Southern California, Arlington, VA, USA
Abstract :
Historically, space-based processing systems have lagged behind their terrestrial counterparts by several processor generations due, in part, to the cost and complexity of implementing radiation-hardened processor designs. Efforts such as NASA´s SpaceCube seek to change this paradigm, using higher performance commercial hardware wherever possible. This has the potential to revolutionize onboard data processing, but it cannot happen unless the soft error reliability can be characterized and deemed sufficient. A variety of fault injection techniques are used to evaluate system reliability, most commonly fault emulation, fault simulation, laser testing, and particle beam testing. Combining multiple techniques is more complex and less common. In this study we characterize a real-world application that leverages a radiation-hardening by software (RHBSW) solution for the SpaceCube platform, using two fault injection strategies: laser testing and fault emulation. We describe several valuable lessons learned, and show how both validation techniques can be combined to greater effect.
Keywords :
aerospace computing; fault tolerant computing; laser beam applications; radiation hardening (electronics); reliability theory; space vehicle electronics; NASA SpaceCube application; RHBSW solution; fault emulation; fault injection techniques; fault simulation; high-performance commercial hardware; laser testing; onboard data processing; particle beam testing; radiation-hardening-by-software solution; soft error reliability; space-based processing systems; system reliability evaluation; validation techniques; Circuit faults; Computer crashes; Emulation; Field programmable gate arrays; Laser applications; Testing;
Conference_Titel :
Dependable Systems and Networks (DSN), 2013 43rd Annual IEEE/IFIP International Conference on
Conference_Location :
Budapest
Print_ISBN :
978-1-4673-6471-3
DOI :
10.1109/DSN.2013.6575354