DocumentCode :
628374
Title :
Carbon nanotube array as high impedance interconnects for sensing device integration
Author :
Dunlin Tan ; Chin Chong Yap ; Hee, David ; JongJen Yu ; Reverchon, Jean-Luc ; Bois, Philippe ; Baillargeat, Dominique ; Beng Kang Tay
Author_Institution :
Thales Solutions Asia Pte Ltd., Singapore, Singapore
fYear :
2013
fDate :
28-31 May 2013
Firstpage :
154
Lastpage :
158
Abstract :
In next generation sensing architectures, compact systems that could enhance manoeuvrability and at the same time diversify sensing capability is similarly carried out through pitch size reduction to incorporate more pixels per unit area. This is because integration of these sensors to its Si read-out circuits has to be technologically compatible for proper signal digitization. In the case of metal interconnects, further down-scaling could lead to higher failure rate, mismatch in coefficient of thermal expansion. In this study, optical interconnects between the sensors and Si read-out circuits using vertically aligned carbon nanotubes arrays in place of indium bump arrays were investigated. Due to the low thermal budget of the sensing device and read-out circuits, vertically aligned carbon nanotube arrays were fabricated at low temperatures. Its material characteristics would be shown. The high dense carbon nanotubes were vertically bonded like in a flip-chip bonding process. Carbon nanotubes from the top chip were inserted between adjacent tubes of the bottom chip. As a result of the close proximity of individual tubes, such arrays could adhere the sensor to the read-out circuits due to stiction at the microscopic scale. This `velcro´ effect could be achieved due to its dense but fin-like structure. Individual bundles of interconnected carbon nanotubes could be equivalent to one pixel. Electro-optical measurements showing its feasibility of using it as optical interconnects for high impedance devices would be evaluated.
Keywords :
carbon nanotubes; elemental semiconductors; failure analysis; optical interconnections; readout electronics; sensor arrays; signal processing; silicon; thermal expansion; Si; bump arrays; coefficient of thermal expansion; electro-optical measurements; fin-like structure; flip-chip bonding process; high impedance interconnects; interconnected carbon nanotubes; metal interconnects; microscopic scale; next generation sensing architectures; optical interconnects; pitch size reduction; read-out circuits; sensing device integration; sensors; signal digitization; thermal budget; velcro effect; vertically aligned carbon nanotubes arrays; Carbon; Carbon nanotubes; Ceramics; Heating; Plasma temperature; Substrates; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
ISSN :
0569-5503
Print_ISBN :
978-1-4799-0233-0
Type :
conf
DOI :
10.1109/ECTC.2013.6575566
Filename :
6575566
Link To Document :
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