DocumentCode :
628380
Title :
Unique adhesion testing and MSL modeling
Author :
Amagai, Masazumi ; Takao, Kazuto
Author_Institution :
Modeling Group, Texas Instrum., Kihara, Japan
fYear :
2013
fDate :
28-31 May 2013
Firstpage :
200
Lastpage :
207
Abstract :
An unique adhesion testing was developed, in which a corner edge of a mold compound was adhered to a lead frame on a diagonal line while making 90° rotation, in addition, mechanical loading was applied to the corner of interfacial edge between dissimilar materials in three point bend tests. The integrated stress modeling during reflow considered five types of modeling, moisture diffusion during moisture preconditioning and reflow, thermal modeling, hygro-mechanical modeling, thermo-mechanical modeling, and vapor pressure modeling for interfacial adhesion strength in three point bend tests and also interfacial delamination in packages. k1, k2, and θ were used as parameters of interfacial adhesion strengths and package delamination. The comparison of all stress integration versus thermal expansion mismatching induced thermal stress was studied for k1, k2 and θ at the interface between mold compound and lead frame. Parameters of interfacial adhesion, k1, k2 and θ, obtained from 3P bend tests were compared with delamination in packages.
Keywords :
adhesion; delamination; diffusion; moisture; moulding; packaging; semiconductor device testing; stress analysis; thermal expansion; thermomechanical treatment; 3P bend tests; MSL modeling; adhesion strengths; corner edge; hygromechanical modeling; integrated stress modeling; interfacial adhesion strength; interfacial delamination; interfacial edge; lead frame; mechanical loading; moisture diffusion; moisture preconditioning; mold compound; package delamination; reflow; stress integration; thermal expansion; thermal modeling; thermal stress; thermo-mechanical modeling; unique adhesion testing; vapor pressure modeling; Adhesives; Compounds; Delamination; Materials; Moisture; Semiconductor device modeling; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
ISSN :
0569-5503
Print_ISBN :
978-1-4799-0233-0
Type :
conf
DOI :
10.1109/ECTC.2013.6575572
Filename :
6575572
Link To Document :
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