• DocumentCode
    628414
  • Title

    Modified thermosonic flip-chip bonding based on electroplated Cu microbumps and concave pads for high-precision low-temperature assembly applications

  • Author

    Tung Thanh Bui ; Suzuki, M. ; Kato, Fumiki ; Watanabe, N. ; Nemoto, Shunsuke ; Kikuchi, Kazuro ; Aoyagi, Masahiro

  • Author_Institution
    Nanoelectron. Res. Inst. (NeRI), Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    425
  • Lastpage
    430
  • Abstract
    Thermosonic flip-chip bonding (TS-FCB) is known as a technique suitable for low-temperature bonding and has been used in many integration applications. In this paper, a modified TS-FCB based on microbumps and concave pads, is presented. Electroplated Cu microbumps, and etched invert-pyramid-shape bonding pads are used to enhance the bonding accuracy of the conventional TS-FCB technique. Experimental validation of the bonding approach is conducted. Reliable bonds, with significant increase in the post-bond accuracy, i.e. within 1 μm range in in-plane offsets, are obtained at 120°C using the proposed bonding approach. These achievements illustrate the ability to use this approach for high-precision low-temperature converging applications.
  • Keywords
    copper; electroplating; flip-chip devices; lead bonding; tape automated bonding; Cu; TS-FCB technique; concave pads; converging applications; electroplated microbumps; etched invert-pyramid-shape bonding pads; high-precision low-temperature assembly applications; integration applications; low-temperature bonding; modified thermosonic flip-chip bonding; post-bond accuracy; temperature 120 degC; Accuracy; Bonding; Force; Friction; Substrates; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575606
  • Filename
    6575606