DocumentCode :
628414
Title :
Modified thermosonic flip-chip bonding based on electroplated Cu microbumps and concave pads for high-precision low-temperature assembly applications
Author :
Tung Thanh Bui ; Suzuki, M. ; Kato, Fumiki ; Watanabe, N. ; Nemoto, Shunsuke ; Kikuchi, Kazuro ; Aoyagi, Masahiro
Author_Institution :
Nanoelectron. Res. Inst. (NeRI), Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
fYear :
2013
fDate :
28-31 May 2013
Firstpage :
425
Lastpage :
430
Abstract :
Thermosonic flip-chip bonding (TS-FCB) is known as a technique suitable for low-temperature bonding and has been used in many integration applications. In this paper, a modified TS-FCB based on microbumps and concave pads, is presented. Electroplated Cu microbumps, and etched invert-pyramid-shape bonding pads are used to enhance the bonding accuracy of the conventional TS-FCB technique. Experimental validation of the bonding approach is conducted. Reliable bonds, with significant increase in the post-bond accuracy, i.e. within 1 μm range in in-plane offsets, are obtained at 120°C using the proposed bonding approach. These achievements illustrate the ability to use this approach for high-precision low-temperature converging applications.
Keywords :
copper; electroplating; flip-chip devices; lead bonding; tape automated bonding; Cu; TS-FCB technique; concave pads; converging applications; electroplated microbumps; etched invert-pyramid-shape bonding pads; high-precision low-temperature assembly applications; integration applications; low-temperature bonding; modified thermosonic flip-chip bonding; post-bond accuracy; temperature 120 degC; Accuracy; Bonding; Force; Friction; Substrates; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
ISSN :
0569-5503
Print_ISBN :
978-1-4799-0233-0
Type :
conf
DOI :
10.1109/ECTC.2013.6575606
Filename :
6575606
Link To Document :
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