DocumentCode :
628421
Title :
Effective voiding control of QFN via solder mask patterning
Author :
Herron, Derrick ; Yan Liu ; Ning-Cheng Lee
Author_Institution :
Indium Corp., Clinton, NY, USA
fYear :
2013
fDate :
28-31 May 2013
Firstpage :
468
Lastpage :
474
Abstract :
Voiding under QFNs is a major challenge in the electronics industry. However, voiding can be suppressed by improving venting accessability on the thermal pad by using solder mask dividing strips. Venting accessability is defined as the perimeter length per unit area of the metal pad. Regardless of the shape and the number of subpads, increasing venting accessability results in a decrease in the total number of voids, the largest voids, and discontinuity. Voiding caused by peripheral vias is comparable to voids caused by hidden vias. Voiding increases with decreasing print coverage and is attributed to insufficient solder. Voiding also decreases with an increase in the number of thermal vias. This phenomenon is attributed to volatiles bleeding through the small voids around the thermal via.
Keywords :
electronics packaging; soldering; solders; voids (solid); QFN; electronics industry; peripheral vias; quad flat no leads package design; solder mask dividing strips; solder mask patterning; thermal pad; thermal vias; venting accessability; voiding control; volatiles bleeding; Electronic packaging thermal management; Hemorrhaging; Metals; Shape; Soldering; Strips; X-ray imaging; QFN; SMT; Solder joint; lead-free; reflow; solder paste; soldering; thermal pad; venting accessibility; void; voiding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
ISSN :
0569-5503
Print_ISBN :
978-1-4799-0233-0
Type :
conf
DOI :
10.1109/ECTC.2013.6575613
Filename :
6575613
Link To Document :
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