DocumentCode :
628471
Title :
High thermal conductive adhesive film for Cu and Al plate adhesion in power eectronics package
Author :
Nonaka, Tomomi ; Shimada, Akira ; Aoki, Kazuo ; Asahi, Noboru
Author_Institution :
Electron. & Imaging Mater. Res. Labs., Toray Ind. Inc., Otsu, Japan
fYear :
2013
fDate :
28-31 May 2013
Firstpage :
790
Lastpage :
795
Abstract :
The high thermal conductive of 10 to 15 W/mK and high heat durable adhesive film has been developed. It is composite of the imide base high heat durable thermosetting resin and high thermal conductive particles. The 1% and 5% weight loss temperature were 384 and 494°C, respectively. Breakdown voltage of the 200 μm thick film was larger than 5 kV at 50 Hz. Insulation reliability was evaluated at 85°C and 85%Rh with applying 750 V and no resistance drop was detected for 1000 hours. The material was mainly designed for thermal interface adhesive of heat generator side lead flame Cu and heat sink Al in power electronics packaging field Coefficient of thermal expansions of Cu and Al were 17 and 23 ppm/°C, respectively. That valued of the adhesive was made up to 19 ppm/°C, which lay between them. The numerical stress analysis of the structure by finite element method was performed. It indicated that the modulus of the adhesive at low temperature affected the stress significantly. Cu (50 mm × 60 mm × 7.5 mm) and Al (70 mm × 80 mm × 6.0 mm) thick plates were adhered by the adhesive and 2000 times thermal cycle durability evaluation between -45 to 125°C were implemented. The sample adhered by the adhesive which was designed to be low modulus at low temperature had no delamination after the thermal cycle, which was investigated by scanning acoustic microscope.
Keywords :
aluminium; conductive adhesives; copper; delamination; durability; electronics packaging; finite element analysis; heat sinks; insulation; reliability; resins; stress analysis; thermal expansion; Al; Cu; Insulation reliability; breakdown voltage; coefficient of thermal expansions; finite element method; frequency 50 Hz; heat generator; high heat durable adhesive film; high heat durable thermosetting resin; high thermal conductive adhesive film; high thermal conductive particles; numerical stress analysis; power electronics packaging; scanning acoustic microscope; size 200 mum; temperature -45 degC to 125 degC; thermal cycle durability evaluation; thermal interface adhesive; thick film; time 1000 hour; voltage 750 V; Conductive adhesives; Films; Heat sinks; Heating; Temperature measurement; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
ISSN :
0569-5503
Print_ISBN :
978-1-4799-0233-0
Type :
conf
DOI :
10.1109/ECTC.2013.6575663
Filename :
6575663
Link To Document :
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