• DocumentCode
    628483
  • Title

    Large silicon, glass and low CTE organic interposers to printed wiring board SMT interconnections using copper microwire arrays

  • Author

    Xian Qin ; Gottschall, Sebastian ; Kumbhat, Nitesh ; Raj, P. Markondeya ; SungJin Kim ; Sundaram, Venky ; Tummala, Rao

  • Author_Institution
    Microsyst. Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    867
  • Lastpage
    871
  • Abstract
    This paper reports SMT-compatible stress-relief microwire arrays in thin polymer carriers, as a unique, novel and low-cost solution for reliable board-level interconnections between large silicon, glass and low coefficient of thermal expansion (CTE) organic interposers and printed wiring boards. The microwire arrays are pre-fabricated in ultra-thin carriers using low-cost manufacturing processes such as laser vias and copper electroplating, which are then assembled onto the back of the interposer as a stress-relief interlayer. Such a structure is assembled onto the board using standard SMT processes. The microwire array results in dramatic reduction in solder stresses and strains, even with larger interposer sizes (20 mm × 20 mm), at finer pitch (300-400 microns), without the need for underfill. The parallel wire arrays result in low resistance and inductance, and therefore do not degrade the electrical performance. The scalability of the structures and the unique processes, from micro to nanowires, provides extendibility to finer pitch and larger package sizes. The first part of the paper describes the design of microwire array to meet the thermo-mechanical reliability requirements. Finite element method (FEM) was used to study the reliability of the interconnections to provide guidelines for the test vehicle design. Strip models were built to study the reliability of 400 μm-pitch interconnections with a 100 μm thick, 20 mm × 20 mm silicon interposer that was SMT-assembled onto an organic printed wiring board. The performance of the microwire array interconnection is compared with that of ball grid array (BGA) interconnection, in warpage, equivalent plastic strain and projected fatigue life. A unique set of materials and processes was used to demonstrate the low-cost fabrication of the microwire array. Flexible thermoplastic polyimide films were used as the polymer film carriers for the microwire interconnection structure. In the in- tial feasibility demonstration, 100 μm thick films with laminated copper foil on both sides of the dielectric were used. A 308 nm excimer laser source was used to ablate the via arrays in the polymer. The microwires were batch fabricated by bottom-up electrolytic plating through the polymer template. A low-cost approach to the microwire fabrication is thus demonstrated by partially releasing the wires with controlled etching of the polymer carrier.
  • Keywords
    ball grid arrays; copper; electroplating; elemental semiconductors; excimer lasers; finite element analysis; polymer films; printed circuit interconnections; silicon; surface mount technology; thick films; CTE organic interposers; Cu; FEM; Si; ball grid array interconnection; bottom-up electrolytic plating; coefficient of thermal expansion organic interposers; copper electroplating; copper microwire arrays; equivalent plastic strain; excimer laser source; fatigue life; finite element method; flexible thermoplastic polyimide films; glass; laser vias; microwire array interconnection; microwire fabrication; nanowires; organic printed wiring board; polymer film; printed wiring board SMT interconnections; printed wiring boards; size 100 mum; size 20 mm; size 400 mum; stress-relief interlayer; thermo-mechanical reliability; thick films; thin polymer carriers; warpage; wavelength 308 nm; Copper; Fatigue; Reliability; Silicon; Strain; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575675
  • Filename
    6575675