DocumentCode :
628487
Title :
Flux-assisted self-assembly with microbump bonding for 3D heterogeneous integration
Author :
Ito, Yu ; Fukushima, Tetsuya ; Kang-Wook Lee ; Choki, Koji ; Tanaka, T. ; Koyanagi, Mitsumasa
Author_Institution :
Dept. of Bioeng. & Robot., Tohoku Univ., Sendai, Japan
fYear :
2013
fDate :
28-31 May 2013
Firstpage :
891
Lastpage :
896
Abstract :
We demonstrated a flip-chip self-assembly with Cu/Sn microbump bonding using surface tension of water-soluble fluxes. By using the self-assembly with the fluxes, 3-mm-square chips were aligned to hydrophilic assembly sites defined on a Si substrates in face-down bonding within approximately 2 μm alignment accuracy. The flux-assisted self-assembly can realize not only the precise chip alignment by high surface tension of the water-soluble fluxes, but also the highly reliable bump bonding with Sn solder in a sequence of self-assembly process. Here, we employed several fluxes as liquids for flip-chip self-assembly and compared the resulting alignment accuracies by changing concentrations of the fluxes. In addition, after microbump bonding, we evaluated electrical characteristics. The resulting daisy chains showed good electrical characteristics with contact resistances of 17 MΩ/bump or below without solder bridges and bonding failures.
Keywords :
flip-chip devices; hydrophilicity; integrated circuit bonding; integrated circuit packaging; self-assembly; soldering; surface tension; three-dimensional integrated circuits; 3D heterogeneous integration; bonding failures; face-down bonding; flip-chip; flux-assisted self-assembly; hydrophilic assembly; microbump bonding; solder bridges; surface tension; water-soluble fluxes; Accuracy; Assembly; Bonding; Liquids; Self-assembly; Substrates; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
ISSN :
0569-5503
Print_ISBN :
978-1-4799-0233-0
Type :
conf
DOI :
10.1109/ECTC.2013.6575679
Filename :
6575679
Link To Document :
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