• DocumentCode
    628510
  • Title

    Electrochemical assembly of SAM on copper for epoxy/copper adhesion improvement

  • Author

    Kwok, Stephen C. T. ; Yuen, M.M.F.

  • Author_Institution
    Dept. of Mech. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    1048
  • Lastpage
    1053
  • Abstract
    This paper reports on adhesion enhancement effects of self-assembled organothiol treatment on copper/epoxy interface, as well as a significant reduction in treatment time by the electrochemical assembly approach. Interfacial adhesion strength between copper/epoxy interfaces was studied against different treatment time under the influence of electrical potential. A maximum 20-fold enhancement was demonstrated through improved chemical linkage formed between copper substrate and epoxy layer. The treatment time was also reduced by 32 times to 1800s with the proposed preparation method. Electrochemical characterization including electrochemical impedance spectroscopy (EIS) was carried out in this work. Results were correlated with adhesion enhancement effect by organothiol self-assembly monolayer (SAM). The double layer capacitance model was used to explain how molecular film formation process affects adhesion results between Cu/epoxy interfaces.
  • Keywords
    adhesion; assembling; copper; monolayers; Cu; EIS; SAM; adhesion enhancement effects; chemical linkage; electrical potential; electrochemical assembly approach; electrochemical characterization; electrochemical impedance spectroscopy; epoxy-copper adhesion improvement; interfacial adhesion strength; molecular film formation process; preparation method; self-assembled organothiol treatment; Adhesives; Copper; Electric potential; Market research; Substrates; Surface impedance; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575702
  • Filename
    6575702