Title :
System level signal and power integrity analysis for 3200Mbps DDR4 interface
Author :
Feng, Jianjiang ; Dhavale, Bipin ; Chandrasekhar, Janani ; Tretiakov, Yuri ; Oh, Dan
Author_Institution :
Altera Corp., San Jose, CA, USA
Abstract :
For single-ended signaling DDR4 channels at 3200Mbps, signal and power integrity issues become increasingly challenging with much smaller voltage and timing windows to balance the budget. As systems increase data rate and IO count, supply noise does not scale accordingly. We present a system level signal and power co-simulation analysis to optimize system performance under stringent timing requirement [1]. Signal integrity of DDR4 interface, such as inter-symbol interference ISI, reflection, and signal cross talk, needs to be minimized in order to meet an ever shrinking timing budget. Also, power delivery network (PDN) design becomes very difficult as a result of smaller die size and multilayer complex package design. SI and PI co-design optimization is driven by both channel performance and overall system cost.
Keywords :
DRAM chips; electronics packaging; noise; optimisation; DDR4 channels; DDR4 interface; PDN design; bit rate 3200 Mbit/s; channel performance; codesign optimization; multilayer complex package design; power cosimulation analysis; power delivery network; power integrity analysis; supply noise; system level signal; Correlation; Crosstalk; Frequency measurement; Impedance; Noise; Silicon; Timing;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4799-0233-0
DOI :
10.1109/ECTC.2013.6575708