DocumentCode :
628541
Title :
From wafer level to panel level mold embedding
Author :
Braun, Torsten ; Becker, Karl-Friedrich ; Voges, S. ; Thomas, Tessamma ; Kahle, R. ; Bauer, J. ; Aschenbrenner, R. ; Lang, K.-D.
Author_Institution :
Fraunhofer Inst. for Reliability & Microintegration, Berlin, Germany
fYear :
2013
fDate :
28-31 May 2013
Firstpage :
1235
Lastpage :
1242
Abstract :
The constant drive to further miniaturization and heterogeneous system integration leads to a need for new packaging technologies which also allow large area processing and 3D integration with potential for low cost applications. Large area mold embedding technologies and embedding of active components into printed circuit boards (Chip-in-Polymer) are two major packaging trends in this area. Mold embedding is currently done on wafer level, typically with diameters of 8“ to 12”, for future process optimization, PCB technologies offer the potential of real large areas up to 610 × 457 mm2. For mold embedding as e.g. for fan-out wafer level packaging compression molding equipment is used in combination with liquid, granular or sheet epoxy molding compounds, with the boundary condition, that mold processes do need a product specific tool (with defined diameter & thickness). Within this paper the potential of tool-less lamination processes, a standard in PCB manufacturing, is evaluated. Lamination is done in panel format using well-known molding compounds from wafer level compression molding. To evaluate the potential of today´s encapsulants for large area embedding processes, different liquid, granular and sheet molding compounds have been intensively evaluated on their processability, on process & material induced die shift and on resulting warpage - all on panel level. Acting as an interconnection layer, PCB based redistribution technologies using lamination of resin coated copper (RCC) films are used. Within the paper, different RCC materials are introduced and discussed concerning their reliability potential based on the available layer thicknesses and thermo-mechanical material properties. The feasibility of the proposed technologies is demonstrated using a two chip package. Dies are embedded in panel size by lamination technologies. Subsequently the wiring is done by lamination of an RCC film over the embedded componen- s and on the panel backside for double sided redistribution. In a process flow also similar to conventional PCB manufacturing μvias to the die pads and through mold vias are drilled using a UV laser and are metalized by Cu-electroplating in one step. This way dies are connected to the front copper layer as well as front to backside of the panel. Conductor lines and pads are formed by Cu etching. Finally, a solder mask and a solderable surface finish are applied. If solder depots are necessary, e.g. for BGA packages, those can be applied by solder balling equipment - either by printing or by preform attach. In summary this paper describes the potential to move from wafer level to panel level mold embedding technology in combination with PCB based redistribution processes. The technology described offers a cost effective packaging solution for e.g. single chip packages as well as for future sensor/ASIC systems or processor/memory stacks in volume production.
Keywords :
copper; electroplating; etching; integrated circuit interconnections; integrated circuit metallisation; integrated circuit reliability; laser materials processing; moulding; polymer films; printed circuit design; resins; solders; thermomechanical treatment; three-dimensional integrated circuits; wafer level packaging; 3D integration; Cu; PCB based redistribution technologies; PCB manufacturing; RCC film; RCC material; UV laser; active component; boundary condition; chip-in-polymer; compression molding equipment; conductor lines; cost effective packaging solution; die pad; die shift; double sided redistribution; electroplating; etching; fan-out wafer level packaging; granular molding compound; heterogeneous system integration; interconnection layer; lamination technologies; large area mold embedding; layer thickness; liquid molding compound; low cost application; metallization; packaging technologies; panel level mold embedding; panel size; preform attach; printed circuit board; process flow; reliability potential; resin coated copper film; sheet epoxy molding compound; single chip package; solder balling equipment; solder depot; solder mask; solderable surface finish; thermo-mechanical material properties; through mold vias; tool-less lamination process; two chip package; wafer level compression molding; wafer level mold embedding; wiring; Compounds; Compression molding; Lamination; Liquids; Resins; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
ISSN :
0569-5503
Print_ISBN :
978-1-4799-0233-0
Type :
conf
DOI :
10.1109/ECTC.2013.6575733
Filename :
6575733
Link To Document :
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