DocumentCode :
628542
Title :
Reliability of embedding concepts for discrete passive components in organic circuit boards
Author :
Schwerz, R. ; Boehme, B. ; Roellig, M. ; Wolter, Klaus-Jurgen ; Meyendorf, N.
Author_Institution :
Electron. Packaging Lab. (IAVT), Tech. Univ. Dresden, Dresden, Germany
fYear :
2013
fDate :
28-31 May 2013
Firstpage :
1243
Lastpage :
1251
Abstract :
This work presents the research towards two promising embedding approaches for electronic components with a possible application to integrate a sensor node for structural health monitoring into the structure itself. The production process for both integration methods has been assessed through experimental and simulation effort. Samples with passive components for both presented approaches have been successfully built. To evaluate the quality of the integration processes, the embedding samples along with regular SMT assemblies were subsequently tested towards reliability using tensile and temperature cycling tests with in-situ measurement. Both testing methods have also been supported with advanced finite element modeling to understand the structural behavior for the integration. The results have shown that both approaches can successfully be applied to integrate electronics into organic material. It was also found that the damage mechanism during the thermo mechanical loading for embedded components differs from conventional SMT assembly because the solder is completely fixated. With a correct manufacturing process this will yield an increase of life time for the electronics.
Keywords :
condition monitoring; electronics packaging; finite element analysis; reliability; structural engineering; surface mount technology; SMT assembly; damage mechanism; discrete passive components; electronic components; embedding concept reliability; finite element modeling; integration methods; manufacturing process; organic circuit boards; organic material; structural behavior; structural health monitoring; temperature cycling testing; tensile testing; thermo mechanical loading; Assembly; Cavity resonators; Finite element analysis; Lamination; Loading; Materials; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
ISSN :
0569-5503
Print_ISBN :
978-1-4799-0233-0
Type :
conf
DOI :
10.1109/ECTC.2013.6575734
Filename :
6575734
Link To Document :
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