• DocumentCode
    628542
  • Title

    Reliability of embedding concepts for discrete passive components in organic circuit boards

  • Author

    Schwerz, R. ; Boehme, B. ; Roellig, M. ; Wolter, Klaus-Jurgen ; Meyendorf, N.

  • Author_Institution
    Electron. Packaging Lab. (IAVT), Tech. Univ. Dresden, Dresden, Germany
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    1243
  • Lastpage
    1251
  • Abstract
    This work presents the research towards two promising embedding approaches for electronic components with a possible application to integrate a sensor node for structural health monitoring into the structure itself. The production process for both integration methods has been assessed through experimental and simulation effort. Samples with passive components for both presented approaches have been successfully built. To evaluate the quality of the integration processes, the embedding samples along with regular SMT assemblies were subsequently tested towards reliability using tensile and temperature cycling tests with in-situ measurement. Both testing methods have also been supported with advanced finite element modeling to understand the structural behavior for the integration. The results have shown that both approaches can successfully be applied to integrate electronics into organic material. It was also found that the damage mechanism during the thermo mechanical loading for embedded components differs from conventional SMT assembly because the solder is completely fixated. With a correct manufacturing process this will yield an increase of life time for the electronics.
  • Keywords
    condition monitoring; electronics packaging; finite element analysis; reliability; structural engineering; surface mount technology; SMT assembly; damage mechanism; discrete passive components; electronic components; embedding concept reliability; finite element modeling; integration methods; manufacturing process; organic circuit boards; organic material; structural behavior; structural health monitoring; temperature cycling testing; tensile testing; thermo mechanical loading; Assembly; Cavity resonators; Finite element analysis; Lamination; Loading; Materials; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575734
  • Filename
    6575734