• DocumentCode
    628544
  • Title

    An approach to board-level drop reliability evaluation with improved correlation with use conditions

  • Author

    Mattila, T.T. ; Vajavaara, L. ; Hokka, J. ; Hussa, E. ; Makela, M. ; Halkola, V.

  • Author_Institution
    Dept. of Electron., Aalto Univ., Aalto, Finland
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    1259
  • Lastpage
    1268
  • Abstract
    The work presented in this paper has been carried out in order to find means to improve the existing methods of board-level drop reliability assessment to better represent the use environment loading conditions of modern portable electronic devices. To provide goals and guidance for the development work, eight commercially available smart phones from different manufacturers were evaluated for their free-fall drop response. The results show that the drop response can be divided conceptually into two parts: (i) forced bending/twisting of the component board at the moment of the impact, and (ii) subsequent (resonance) vibration of the component board. The strain magnitudes caused by the forced bending and twisting were much higher than those by the post impact vibrations. Furthermore, sharp strain peaks were often identified within a few milliseconds from the impacts. The results of the Finite Element simulations show that the distribution of strains on the component boards is highly nonuniform; The regions of high strain are localized because they are caused either by the forced bending (by surrounding covers and frames in part i) or by internal collisions between the component board and the surrounding mechanical structures (sharp strain peaks in part ii). The devices were characterized for maximum strain, average rate to maximum strain, vibration frequencies and maximum value of deceleration. The following goals were set for the development of a board-level drop test methodology: a test board that simulates the response of modern portable products should be able to produce board strain well above 3 500 μ (“micro-strain” = [10-6 m/m]) and mean rate to maximum strain close to 7 s-1. Reaching these objectives requires significant changes to the existing JESD22-B111 approach. An investigation on the effects of the shape of deceleration input pulse was carried out first, followed by modifications for the board support to fur- her increase the maximum strain and the average strain-rate of the JESD22-B111 compliant printed wiring board. The support was modified by replacing the four point supports by line supports at both ends of the rectangular shaped board. This approach can achieve the maximum strains of 5 000 μ when coupled with the optimized deceleration input. In addition to the increased strain and strain-rate, dampening of the board vibration became more effective, which is also in a better agreement with the typical drop response of portable electronic products.
  • Keywords
    finite element analysis; integrated circuit reliability; printed circuits; smart phones; JESD22-B111 approach; board vibration; board-level drop reliability; component board; environment loading conditions; finite element simulations; forced bending-twisting; impact vibrations; internal collisions; mechanical structures; portable electronic devices; portable electronic products; printed wiring board; rectangular shaped board; smart phones; vibration frequency; Finite element analysis; History; Reliability; Shape; Strain; Strain measurement; Vibrations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575736
  • Filename
    6575736