DocumentCode :
628572
Title :
L70 life prediction for solid state lighting using Kalman Filter and Extended Kalman Filter based models
Author :
Lall, P. ; Junchao Wei ; Davis, Lisa
Author_Institution :
Dept. of Mech. Eng., Auburn Univ., Auburn, AL, USA
fYear :
2013
fDate :
28-31 May 2013
Firstpage :
1452
Lastpage :
1465
Abstract :
Solid-state lighting (SSL) luminaires containing light emitting diodes (LEDs) have the potential of seeing excessive temperatures when being transported across country or being stored in non-climate controlled warehouses. They are also being used in outdoor applications in desert environments that see little or no humidity but will experience extremely high temperatures during the day. This makes it important to increase our understanding of what effects high temperature exposure for a prolonged period of time will have on the usability and survivability of these devices. Traditional light sources “burn out” at end-of-life. For an incandescent bulb, the lamp life is defined by B50 life. However, the LEDs have no filament to “burn”. The LEDs continually degrade and the light output decreases eventually below useful levels causing failure. Presently, the TM-21 test standard is used to predict the L70 life of LEDs from LM-80 test data. Several failure mechanisms may be active in a LED at a single time causing lumen depreciation. The underlying TM-21 Model may not capture the failure physics in presence of multiple failure mechanisms. Correlation of lumen maintenance with underlying physics of degradation at system-level is needed. In this paper, Kalman Filter (KF) and Extended Kalman Filters (EKF) have been used to develop a 70-percent Lumen Maintenance Life Prediction Model for LEDs used in SSL luminaires. Ten-thousand hour LM-80 test data for various LEDs have been used for model development. System state at each future time has been computed based on the state space at preceding time step, system dynamics matrix, control vector, control matrix, measurement matrix, measured vector, process noise and measurement noise. The future state of the lumen depreciation has been estimated based on a second order Kalman Filter model and a Bayesian Framework. The measured state variable has been related to the underlying damage using physics-base- models. Life prediction of L70 life for the LEDs used in SSL luminaires from KF and EKF based models have been compared with the TM-21 model predictions and experimental data.
Keywords :
Bayes methods; Kalman filters; failure analysis; light emitting diodes; light sources; nonlinear filters; B50 life; Bayesian framework; L70 life prediction; LED; LM-80 test data; SSL luminaires; TM-21 test standard; extended Kalman filter; failure mechanism; incandescent bulb; light emitting diodes; light sources; lumen maintenance life prediction; measurement noise; physics-based models; solid state lighting; Color; Degradation; Image color analysis; Kalman filters; Light emitting diodes; Lighting; Maintenance engineering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
ISSN :
0569-5503
Print_ISBN :
978-1-4799-0233-0
Type :
conf
DOI :
10.1109/ECTC.2013.6575764
Filename :
6575764
Link To Document :
بازگشت