• DocumentCode
    628577
  • Title

    The effect of corner glue on BGA package temperature cycling performance: A modeling study

  • Author

    Min Pei ; Ru Han ; Yun Ge ; Goyal, Shri ; Rajarathinam, Venmathy ; Mukadam, Mustafa

  • Author_Institution
    Intel Corp., Hillsboro, OR, USA
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    1494
  • Lastpage
    1499
  • Abstract
    It is well known that corner glue (CG) applied at the corner of BGA packages can mitigate shock and vibration risk in solder joints at the package corners. With certain materials, CG may improve solder joint temperature cycling performance. Based on finite element modeling studies, the effect of CG on package solder joint damage in temperature cycle testing is categorized into two aspects out of plane (OOP) deformation and shear deformation. Corner solder joint OOP deformation is related to the coefficient of thermal expansion (CTE) of the CG. CG also serves to reduce shear deformation in solder joints at package corners. Mechanical models with different complexities were analyzed to demonstrate these two effects.
  • Keywords
    adhesive bonding; ball grid arrays; finite element analysis; solders; thermal expansion; vibrations; BGA package temperature cycling performance; coefficient of thermal expansion; corner glue; finite element modeling; out of plane deformation; package solder joint; shear deformation; shock mitigation; solder joints; temperature cycle testing; vibration risk; Adaptation models; Fatigue; Finite element analysis; Materials; Soldering; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575769
  • Filename
    6575769