DocumentCode
628577
Title
The effect of corner glue on BGA package temperature cycling performance: A modeling study
Author
Min Pei ; Ru Han ; Yun Ge ; Goyal, Shri ; Rajarathinam, Venmathy ; Mukadam, Mustafa
Author_Institution
Intel Corp., Hillsboro, OR, USA
fYear
2013
fDate
28-31 May 2013
Firstpage
1494
Lastpage
1499
Abstract
It is well known that corner glue (CG) applied at the corner of BGA packages can mitigate shock and vibration risk in solder joints at the package corners. With certain materials, CG may improve solder joint temperature cycling performance. Based on finite element modeling studies, the effect of CG on package solder joint damage in temperature cycle testing is categorized into two aspects out of plane (OOP) deformation and shear deformation. Corner solder joint OOP deformation is related to the coefficient of thermal expansion (CTE) of the CG. CG also serves to reduce shear deformation in solder joints at package corners. Mechanical models with different complexities were analyzed to demonstrate these two effects.
Keywords
adhesive bonding; ball grid arrays; finite element analysis; solders; thermal expansion; vibrations; BGA package temperature cycling performance; coefficient of thermal expansion; corner glue; finite element modeling; out of plane deformation; package solder joint; shear deformation; shock mitigation; solder joints; temperature cycle testing; vibration risk; Adaptation models; Fatigue; Finite element analysis; Materials; Soldering; Temperature distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location
Las Vegas, NV
ISSN
0569-5503
Print_ISBN
978-1-4799-0233-0
Type
conf
DOI
10.1109/ECTC.2013.6575769
Filename
6575769
Link To Document