DocumentCode :
628577
Title :
The effect of corner glue on BGA package temperature cycling performance: A modeling study
Author :
Min Pei ; Ru Han ; Yun Ge ; Goyal, Shri ; Rajarathinam, Venmathy ; Mukadam, Mustafa
Author_Institution :
Intel Corp., Hillsboro, OR, USA
fYear :
2013
fDate :
28-31 May 2013
Firstpage :
1494
Lastpage :
1499
Abstract :
It is well known that corner glue (CG) applied at the corner of BGA packages can mitigate shock and vibration risk in solder joints at the package corners. With certain materials, CG may improve solder joint temperature cycling performance. Based on finite element modeling studies, the effect of CG on package solder joint damage in temperature cycle testing is categorized into two aspects out of plane (OOP) deformation and shear deformation. Corner solder joint OOP deformation is related to the coefficient of thermal expansion (CTE) of the CG. CG also serves to reduce shear deformation in solder joints at package corners. Mechanical models with different complexities were analyzed to demonstrate these two effects.
Keywords :
adhesive bonding; ball grid arrays; finite element analysis; solders; thermal expansion; vibrations; BGA package temperature cycling performance; coefficient of thermal expansion; corner glue; finite element modeling; out of plane deformation; package solder joint; shear deformation; shock mitigation; solder joints; temperature cycle testing; vibration risk; Adaptation models; Fatigue; Finite element analysis; Materials; Soldering; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
ISSN :
0569-5503
Print_ISBN :
978-1-4799-0233-0
Type :
conf
DOI :
10.1109/ECTC.2013.6575769
Filename :
6575769
Link To Document :
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