• DocumentCode
    628607
  • Title

    Wettability of Sn-Bi and Sn-Ag-Cu lead-free solder pastes on electroplated Co-P films

  • Author

    Donghua Yang ; Nianduan Lu ; Liangliang Li

  • Author_Institution
    Key Lab. of Adv. Mater., Tsinghua Univ., Beijing, China
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    1686
  • Lastpage
    1691
  • Abstract
    The wettability of the molten lead-free solder on the substrate is an important property for the lead-free solder joints in electronic products. In this paper, we investigated the wettability of lead-free solder pastes on electroplated Co-P films. We measured the contact angles of one kind of Sn-Bi and two kinds of Sn-Ag-Cu (SAC305 and SAC387) solder pastes on the Co-P films with nanocrystalline, amorphous and mixed structures and studied the dependence of the contact angles of the molten solders on the microstructure of the Co-P film. The experimental data showed that in general the amorphous Co-P film with a large phosphorous content was favorable for all three solder pastes in terms of wettability. SAC305 had a contact angle less than 10° on the amorphous Co-P film and Sn-Bi had a contact angle of about 20° on it. Although SAC387 spread out completely on the amorphous and mixed Co-P films, Sn in SAC387 diffused quickly into the Co-P films and even penetrated the films. In addition, we observed the cross-sections of the solder joints, studied the interfacial reaction between the solders and the Co-P films by scanning electron microscopy and explained the variation of the contact angles of the solders on different Co-P films.
  • Keywords
    bismuth alloys; cobalt alloys; contact angle; copper alloys; phosphorus alloys; silver alloys; solders; tin alloys; wetting; Co-P; SAC305 solder; Sn-Ag-Cu; Sn-Bi; amorphous structure; contact angle; electronic product; electroplated films; lead free solder joints; lead-free solder paste wettability; mixed structure; molten lead-free solder; nanocrystalline structure; solder joint cross section; Films; Heating; Lead; Microstructure; Scanning electron microscopy; Soldering; Substrates; Co-P film; Lead-free solder; Sn-Ag-Cu; Sn-Bi; Wettability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575800
  • Filename
    6575800