DocumentCode :
628607
Title :
Wettability of Sn-Bi and Sn-Ag-Cu lead-free solder pastes on electroplated Co-P films
Author :
Donghua Yang ; Nianduan Lu ; Liangliang Li
Author_Institution :
Key Lab. of Adv. Mater., Tsinghua Univ., Beijing, China
fYear :
2013
fDate :
28-31 May 2013
Firstpage :
1686
Lastpage :
1691
Abstract :
The wettability of the molten lead-free solder on the substrate is an important property for the lead-free solder joints in electronic products. In this paper, we investigated the wettability of lead-free solder pastes on electroplated Co-P films. We measured the contact angles of one kind of Sn-Bi and two kinds of Sn-Ag-Cu (SAC305 and SAC387) solder pastes on the Co-P films with nanocrystalline, amorphous and mixed structures and studied the dependence of the contact angles of the molten solders on the microstructure of the Co-P film. The experimental data showed that in general the amorphous Co-P film with a large phosphorous content was favorable for all three solder pastes in terms of wettability. SAC305 had a contact angle less than 10° on the amorphous Co-P film and Sn-Bi had a contact angle of about 20° on it. Although SAC387 spread out completely on the amorphous and mixed Co-P films, Sn in SAC387 diffused quickly into the Co-P films and even penetrated the films. In addition, we observed the cross-sections of the solder joints, studied the interfacial reaction between the solders and the Co-P films by scanning electron microscopy and explained the variation of the contact angles of the solders on different Co-P films.
Keywords :
bismuth alloys; cobalt alloys; contact angle; copper alloys; phosphorus alloys; silver alloys; solders; tin alloys; wetting; Co-P; SAC305 solder; Sn-Ag-Cu; Sn-Bi; amorphous structure; contact angle; electronic product; electroplated films; lead free solder joints; lead-free solder paste wettability; mixed structure; molten lead-free solder; nanocrystalline structure; solder joint cross section; Films; Heating; Lead; Microstructure; Scanning electron microscopy; Soldering; Substrates; Co-P film; Lead-free solder; Sn-Ag-Cu; Sn-Bi; Wettability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
ISSN :
0569-5503
Print_ISBN :
978-1-4799-0233-0
Type :
conf
DOI :
10.1109/ECTC.2013.6575800
Filename :
6575800
Link To Document :
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