Title :
A breakthrough in power electronics reliability — New die attach and wire bonding materials
Author :
Krebs, Thomas ; Duch, Susanne ; Schmitt, Wagner ; Kotter, Steffen ; Prenosil, Peter ; Thomas, Stephan
Author_Institution :
Heraeus Mater. Technol. GmbH & Co. KG, Hanau, Germany
Abstract :
Power Electronics on DCB are used for high power devices. There is a wide field of applications for such power electronic devices like converters or inverters for wind mills, solar parks or for electric and hybrid vehicles. High efficiency, long life time and increased power density are the major technical requirements for those devices. Especially the life time, but also the power density are limited by die attach and wire bond materials. New material solutions to overcome these limitations in life time will be discussed in this paper. Results of an active power cycling test of DCB devices supported by the failure analysis and material data will be used to demonstrate and explain the novel materials advantages versus conventional solutions.
Keywords :
failure analysis; lead bonding; power semiconductor devices; semiconductor device reliability; semiconductor device testing; DCB devices; active power cycling test; conventional solutions; converters; die attach; electric vehicles; failure analysis; high power devices; hybrid vehicles; inverters; material data; power density; power electronic devices; power electronics reliability; solar parks; technical requirements; wind mills; wire bonding materials; Current measurement; Fatigue; Materials; Microassembly; Silver; Temperature; Wires;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4799-0233-0
DOI :
10.1109/ECTC.2013.6575811