• DocumentCode
    628626
  • Title

    Reliability study of isotropic electrically conductive adhesives under thermal cycling testing

  • Author

    Frisk, Laura ; Lahokallio, Sanna ; Mostofizadeh, M. ; Kiilunen, Janne ; Saarinen, Kirsi

  • Author_Institution
    Dept. of Electron., Tampere Univ. of Technol., Tampere, Finland
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    1794
  • Lastpage
    1799
  • Abstract
    Electrically conductive adhesives (ECA) have potential for low cost, high reliability, and simple processing. Additionally, an important advantage with ECA materials is the possibility for low bonding temperature. Therefore, they are especially well suited for low cost applications. ECA materials are prepared by mixing polymer matrix with electrically conductive particles. In isotropic conductive adhesives (ICA) concentration of the conductive particles is high and they conduct in all directions. Several materials can be used to manufacture ICAs. The most widely used ICAs in the electronics industry are silver-filled epoxies. However, other polymers can also be used. Currently, ECAs are increasingly used under demanding environments, inh which fluctuation of temperature is a common environmental stress. Such fluctuation causes stresses to form in the interconnections and are a common reason for failures in electronics devices. The interconnections formed with ICA are often not as mechanically robust as those with solders making it especially important to study how thermal fluctuations affect the ICA materials. In this work eight different commercial ICA materials were studied using two different thermal cycling tests. Additionally, low temperature tin-bismuth (Sn-Bi) solder was studied as a reference material. To study the behavior of the ICAs and the solder they were used to attach zero ohm resistors onto FR-4 test boards. After assembly testing of the samples was conducted in thermal shock and thermal cycling tests between -40°C and +125 °C. Marked changes were seen in the resistance values of the test samples during the test. Additionally, clear variation was seen between the ICAs. Apart from one ICA slow thermal cycling test was found to be more detrimental than the faster shock testing.
  • Keywords
    adhesives; assembling; bismuth alloys; electrical conductivity; polymers; reliability; tin alloys; ECA materials; FR-4 test boards; ICA concentration; ICA materials; Sn-Bi; assembly testing; electrically conductive adhesive material; electrically conductive particles; electronics devices; electronics industry; environmental stress; isotropic conductive adhesives concentration; isotropic electrically conductive adhesives; polymer matrix; reliability study; silver-filled epoxies; temperature -40 degC to 125 degC; thermal cycling testing; thermal fluctuations; thermal shock; tin-bismuth solder; zero ohm resistors; Delamination; Electrical resistance measurement; Materials; Resistance; Resistors; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575819
  • Filename
    6575819