Title :
DC wander effect of DC blocking capacitors on PCIe Gen3 signal integrity
Author :
Na, Neil ; Dreps, D.M. ; Hejase, Jose A.
Author_Institution :
IBM Syst. & Technol. Group, Austin, TX, USA
Abstract :
This paper discusses the impact of DC wander also called baseline wander resulting from AC-coupling on signal integrity in receive waveforms in AC-coupled serial bus links with focus on PCIe Gen3 signaling. Receive signal behavior from charging and discharging activities of AC-coupling circuit is studied for fundamental understanding of baseline wander and its effect through simulations of short and long channels from various aspects of PCIe Gen3 signaling and high speed serial links in general.
Keywords :
capacitors; coupled circuits; peripheral interfaces; AC-coupled serial bus link circuit; DC baseline wander effect; DC blocking capacitor; PCIe Gen3 Signal Integrity; waveform receiver; Capacitance; Capacitors; Encoding; Propagation losses; Standards; Training; Voltage measurement;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4799-0233-0
DOI :
10.1109/ECTC.2013.6575863