• DocumentCode
    628698
  • Title

    Assembly level digital image correlation under reflow and thermal cycling conditions

  • Author

    Ralph, W. Carter ; Raiser, G.F.

  • Author_Institution
    Southern Res. Inst., Birmingham, AL, USA
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    2223
  • Lastpage
    2227
  • Abstract
    Digital image correlation is an attractive displacement measurement method for thermo-mechanical characterization and simulation of electronic assemblies, but faces a number of challenges to implementation. In this paper, a batch reflow oven with a large window was used to allow for optical measurements, and hardware modifications and test methods were developed to enable successful data acquisition under both reflow and thermal cycling conditions. The modified hardware setup is detailed, test methods are presented, and two examples of successful experiments are demonstrated.
  • Keywords
    correlation methods; image processing; integrated circuit reliability; integrated circuit testing; life testing; solders; thermomechanical treatment; batch reflow oven; data acquisition; digital image correlation; electronic assemblies simulation; optical measurements; reflow conditions; thermal cycling conditions; thermomechanical characterization; Assembly; Cooling; Heating; Nitrogen; Optical distortion; Ovens; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575891
  • Filename
    6575891