DocumentCode
628698
Title
Assembly level digital image correlation under reflow and thermal cycling conditions
Author
Ralph, W. Carter ; Raiser, G.F.
Author_Institution
Southern Res. Inst., Birmingham, AL, USA
fYear
2013
fDate
28-31 May 2013
Firstpage
2223
Lastpage
2227
Abstract
Digital image correlation is an attractive displacement measurement method for thermo-mechanical characterization and simulation of electronic assemblies, but faces a number of challenges to implementation. In this paper, a batch reflow oven with a large window was used to allow for optical measurements, and hardware modifications and test methods were developed to enable successful data acquisition under both reflow and thermal cycling conditions. The modified hardware setup is detailed, test methods are presented, and two examples of successful experiments are demonstrated.
Keywords
correlation methods; image processing; integrated circuit reliability; integrated circuit testing; life testing; solders; thermomechanical treatment; batch reflow oven; data acquisition; digital image correlation; electronic assemblies simulation; optical measurements; reflow conditions; thermal cycling conditions; thermomechanical characterization; Assembly; Cooling; Heating; Nitrogen; Optical distortion; Ovens; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location
Las Vegas, NV
ISSN
0569-5503
Print_ISBN
978-1-4799-0233-0
Type
conf
DOI
10.1109/ECTC.2013.6575891
Filename
6575891
Link To Document