DocumentCode :
628701
Title :
Design, fabrication and assembly of a novel electrical and microfluidic I/Os for 3-D chip stack and silicon interposer
Author :
Li Zheng ; Yue Zhang ; Bakir, Muhannad S.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2013
fDate :
28-31 May 2013
Firstpage :
2243
Lastpage :
2248
Abstract :
A novel chip I/O technology, which enables high-bandwidth signaling, embedded microfluidic cooling and power delivery for high-performance 2.5D (silicon interposer) and 3D integrated circuits is presented. It features annular-shaped fluidic microbumps with 150 μm inner diameter and 210 μm outer diameter and fine-pitch electrical microbumps with 25 μm diameter and 50 μm pitch. Silicon dice with the novel electrical and fluidic I/O interconnections and die-level embedded microfluidic cooling were successfully fabricated and assembled. Following assembly, the measured resistance of a single electrical microbump is 13.50 MΩ ± 1.82 MΩ. Fluidic testing was conducted by pumping DI water into the bonded dice at a flow rate of up to 50 mL. No leakage or pressure drop change occurred during testing, and thus, demonstrating the feasibility of the novel fluidic I/O interconnections. In addition, the impact of the number of power delivery microbumps and die thickness (as a result of embedded microfluidic cooling) on power supply noise is analyzed using a compact physical model.
Keywords :
cooling; elemental semiconductors; integrated circuit design; integrated circuit interconnections; microfabrication; microfluidics; silicon; three-dimensional integrated circuits; 3D chip stack; 3D integrated circuits; DI water; annular-shaped fluidic microbumps; assembly; compact physical model; die-level embedded microfluidic cooling; electrical I/O interconnections; electrical I/O technology; fine-pitch electrical microbumps; fluidic I/O interconnections; high-bandwidth signaling; high-performance 2.5D integrated circuits; microfluidic I/O technology; power delivery; power supply noise; silicon dice; silicon interposer; Electrical resistance measurement; Fluidic microsystems; Heat sinks; Microfluidics; Resistance; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
ISSN :
0569-5503
Print_ISBN :
978-1-4799-0233-0
Type :
conf
DOI :
10.1109/ECTC.2013.6575894
Filename :
6575894
Link To Document :
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