• DocumentCode
    628720
  • Title

    Power dissipation analysis for different configurations of TSVs at high (GHz) frequencies

  • Author

    Singh, Ajay Vikram ; Chaturvedi, Divyansh ; Singh, S.G. ; Khan, Mohammed Zafar Ali

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol., Hyderabad, Hyderabad, India
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    2356
  • Lastpage
    2360
  • Abstract
    The paper examines the power dissipation patterns of different TSV interconnect configurations which could be employed in 3D IC. 1-TSV, 2-TSV, 3-TSV (straight line configuration, triangular configuration) and 6-TSV (rectangular configuration, hexagonal configuration) systems have been analyzed using the FEM based software Comsol Multiphysics (ver 4.2a). Co-axial variation of the TSV has been included in the analysis. The simulation results show that a single cuboidal TSV has considerably more power dissipation than a single cylindrical TSV and hence has been neglected in further analyses in favor of the cylindrical TSVs. The triangular configuration of 3-TSV system is found to have lesser power dissipation than the straight line configuration, although the peak power dissipation is more in the triangular configuration. In the case of 6-TSV system, the rectangular and hexagonal configurations have approximately same power dissipation, though the peak power dissipation is slightly higher in the case of rectangular configuration. The consequences of power dissipation patterns in multi-TSV systems for thermal mitigation are discussed. Finally it is shown that coaxial TSV outperforms cylindrical TSV in terms of power dissipation. Misalignments during fabrication process could lead to deviations from ideal co-axiality, the effect of which is also analyzed.
  • Keywords
    electronic engineering computing; finite element analysis; three-dimensional integrated circuits; 1-TSV systems; 2-TSV systems; 3-TSV systems; 3D IC; 6-TSV systems; FEM based software comsol multiphysics; coaxial variation; fabrication process; finite element method based simulation software; hexagonal configuration; high GHz frequencies; multi-TSV systems; power dissipation analysis; rectangular configuration; single cuboidal TSV; straight line configuration; thermal mitigation; three dimensional integration; through silicon via interconnect configurations; triangular configuration; Integrated circuit modeling; Load flow analysis; Power dissipation; Silicon; Simulation; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575913
  • Filename
    6575913