• DocumentCode
    62954
  • Title

    MULTES: Multilevel Temporal-Parallel Event-Driven Simulation

  • Author

    Dusung Kim ; Ciesielski, Maciej ; Seiyang Yang

  • Author_Institution
    Synopsys, Inc., Mountain View, CA, USA
  • Volume
    32
  • Issue
    6
  • fYear
    2013
  • fDate
    Jun-13
  • Firstpage
    845
  • Lastpage
    857
  • Abstract
    Multilevel temporal-parallel event-driven simulation is a new radically different approach to simulation of designs described in Verilog HDL. It is based on a concept of time-parallel simulation applied to gate-level timing simulation. The simulation is performed in two steps: 1) fast reference simulation that runs on a higher, reference-level design model (typically RTL) and saves the design state at predetermined checkpoints; and 2) target simulation, which runs on a lower, gate-level model and distributes the simulation run slices to individual simulators. The paper addresses a number of important issues that make this approach practical: 1) finding initial state for each simulation slice; 2) resolving initial state mismatches; and 3) handling designs with multiple asynchronous clocks. Experimental results performed on industrial designs demonstrate the validity and efficiency of the method in terms of its performance and the debugging efficiency.
  • Keywords
    clocks; hardware description languages; parallel algorithms; MULTES; Verilog HDL; debugging efficiency; gate-level model; gate-level timing simulation; industrial designs; initial state mismatching; multilevel temporal-parallel event-driven simulation; multiple asynchronous clocks; predetermined checkpoints; reference-level design model; simulation slice; target simulation; time-parallel simulation; Computational modeling; Integrated circuit modeling; Logic gates; Protocols; Registers; Synchronization; Parallel simulation; Verilog simulation; state matching; timing simulation;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2013.2237769
  • Filename
    6516614