• DocumentCode
    629621
  • Title

    Towards automated analysis of fads and trends in information systems research: Concept, implementation and exemplary application in the context of business process management research

  • Author

    Houy, Constantin ; Sainbuyan, Khulan ; Fettke, Peter ; Loos, Peter

  • Author_Institution
    Inst. for Inf. Syst. (IWi), Saarland Univ. Saarbrucken, Saarbrucken, Germany
  • fYear
    2013
  • fDate
    29-31 May 2013
  • Firstpage
    1
  • Lastpage
    11
  • Abstract
    Information Systems (IS) research strives for the design of innovative as well as the investigation of existing methods and techniques for information management in organizations. IS methods and techniques can support the automation of operational tasks as well as management tasks in organizations. Furthermore, they offer considerable potential for the automation of research processes in IS research. This paper examines the potential and boundaries of automated analyses of fads and trends in the field of IS research based on a design-oriented research approach. A concept for automated trend analysis is developed and implemented in an innovative software tool. The proof of concept software is exemplarily applied for the investigation of fads and trends in Business Process Management (BPM) research as an important field in IS research. Moreover, the potential and boundaries of the presented approach are discussed.
  • Keywords
    business data processing; information management; information systems; BPM; automated trend analysis; business process management research; design-oriented research approach; fad analysis; information management; information system research; innovative software tool; research process automation; Context; Information systems; Manuals; Market research; Prototypes; Software; Fads and trends; automation; information retrieval; software tools for research; text mining;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Research Challenges in Information Science (RCIS), 2013 IEEE Seventh International Conference on
  • Conference_Location
    Paris
  • ISSN
    2151-1349
  • Print_ISBN
    978-1-4673-2912-5
  • Type

    conf

  • DOI
    10.1109/RCIS.2013.6577717
  • Filename
    6577717