Title :
Analysis on temperature coefficient of a low-voltage current mirror
Author :
Wada, Kazuyoshi ; Takano, Masatoshi ; Sekine, Keisuke
Author_Institution :
Dept. of Electron. & Bioinf., Meiji Univ., Kawasaki, Japan
Abstract :
The current mirror where the bulk terminal of each MOSFET is connected with itself gate terminal for low-voltage operation is investigated from the view point of temperature characteristic. Temperature coefficient is analyzed and it is clarified that the low-voltage current mirror can have small sensitivity with respect to the temperature.
Keywords :
MOSFET; mirrors; MOSFET; gate terminal; low-voltage current mirror; low-voltage operation; temperature coefficient; Logic gates; MOSFET; Mathematical model; Mirrors; Temperature distribution; Temperature sensors; bulk terminal; current mirror; temperature coefficient; weak inversion region;
Conference_Titel :
Faible Tension Faible Consommation (FTFC), 2013 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4673-6105-7
DOI :
10.1109/FTFC.2013.6577777
