DocumentCode :
629928
Title :
A comparative study between 4H-SiC and silicon power PiN diode having the same breakdown voltage 4KV
Author :
Jedidi, Anis ; Garrab, Hatem ; Besbes, Khaoula
Author_Institution :
Microelectron. & Instrum. UR FSM, Univ. of Monastir, Monastir, Tunisia
fYear :
2013
fDate :
21-23 March 2013
Firstpage :
1
Lastpage :
5
Abstract :
The exploitation of silicon carbide semiconductor devices in power electronic field have made exceptional improvements by their fast switching and low dissipated losses especially at high operating temperatures, However, physical performances of silicon power components have reached their limits. This paper presents a comparative study, through numerical simulation and using the finite element method modeling, between 4H-SiC and silicon power PiN diode having the same breakdown voltage “4KV”. This comparative study highlights the benefits of silicon carbide.
Keywords :
elemental semiconductors; finite element analysis; p-i-n diodes; power electronics; silicon compounds; 4H-SiC; Si; SiC; finite element method; power electronic field; silicon carbide semiconductor device; silicon power PiN diode; silicon power component; switching; voltage 4 kV; Doping; Mathematical model; Numerical models; PIN photodiodes; Semiconductor diodes; Silicon; Silicon carbide; 4H-SiC; Diode PiN; Numerical Simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Engineering and Software Applications (ICEESA), 2013 International Conference on
Conference_Location :
Hammamet
Print_ISBN :
978-1-4673-6302-0
Type :
conf
DOI :
10.1109/ICEESA.2013.6578428
Filename :
6578428
Link To Document :
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