Title :
A +0.4°C accurate high-speed remote junction temperature sensor with digital Beta correction and series-resistance cancellation in 65nm CMOS
Author :
Xiao Pu ; Ash, Matthew ; Nagaraj, Kanthi ; Park, Jongho ; Vu, Steve ; Kimelman, Paul ; de la Haye, Sean
Author_Institution :
Texas Instrum., Dallas, TX, USA
Abstract :
A true remote junction temperature sensor (RTS) with 3σ accuracy of 0.4 degrees over a temperature range of -40 to 130 degrees is presented. Using a novel digital beta compensation technique and series resistance cancellation (SRC), the sensor is capable of handling parasitic BJTs buried in other SoCs on a PCB located at large distances. The IC is manufactured in a 65nm digital CMOS process.
Keywords :
CMOS digital integrated circuits; bipolar transistors; delta-sigma modulation; printed circuits; series (mathematics); system-on-chip; temperature sensors; PCB; RTS; SRC; SoC; digital Beta correction; digital CMOS process; digital beta compensation technique; high-speed remote junction temperature sensor; parasitic BJT; series resistance cancellation; series-resistance cancellation; size 65 nm; temperature range; Accuracy; CMOS integrated circuits; Current density; Resistance; System-on-chip; Temperature measurement; Temperature sensors; Beta correction; Temperature sensor; delta sigma modulator;
Conference_Titel :
VLSI Circuits (VLSIC), 2013 Symposium on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-5531-5
