3D IC heterogeneous integration of GPS RF receiver, baseband, and DRAM on CoWoS with system BIST solution

Author

Liao, W.S. ; Chen, H.N. ; Yen, K.K. ; Yeh, E.H. ; Kuo, F.W. ; Yeh, T.J. ; Kuo, Fei-Ching ; Jou, C.P. ; Liu, Siyuan ; Hsueh, F.L. ; Lin, H.C. ; Peng, C.N. ; Wang, Maximilian J. ; Wu, W.C. ; Hu, S.P. ; Chen, Mayee F. ; Hou, S.Y. ; Jeng, S.P. ; Yu, Cody Hao

Author_Institution

R&D, Taiwan Semicond. Manuf. Co., Ltd., Hsinchu, Taiwan

fYear

2013

fDate

12-14 June 2013

Abstract

A 3D IC heterogeneous chip integration of 65nm RF receiver, 28nm baseband processor, and 40nm DRAM on a proprietary CoWoS structure is demonstrated and its electrical characterization of KGS (Known Good Stack) has revealed a highly comparable system performance as compared to that of the KGD (Known Good Die) testing data. Moreover, an innovative system BIST (Built-in-Self-Test) scheme and methodology have been designed to save screening time by over 90% as compared to that of the conventional ATE full functional test. This work also exhibits an emerging application possibility for all other CoWoS related system integration such as smart mobile devices, smart consumer electronics, remote medical diagnosis and smart car telemetry, etc.

Keywords

DRAM chips; Global Positioning System; built-in self test; integrated circuit testing; radio receivers; three-dimensional integrated circuits; 3D IC heterogeneous chip integration; ATE full functional test; DRAM; GPS RF receiver; KGD; KGS; baseband processor; built-in-self-test scheme; known good die testing data; known good stack; proprietary CoWoS structure; remote medical diagnosis; size 28 nm; size 40 nm; size 65 nm; smart car telemetry; smart consumer electronics; smart mobile device; system BIST solution; Baseband; Built-in self-test; Global Positioning System; Radio frequency; Random access memory; Receivers; 3D IC; BIST; Baseband; CoWoS; DRAM; GPS;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Circuits (VLSIC), 2013 Symposium on

Conference_Location

Kyoto

Print_ISBN

978-1-4673-5531-5

Type

conf

Filename

6578710