Title :
The edge effect: Exploring high crime zones near residential neighborhoods
Author :
Song, Jian ; Spicer, Valerie ; Brantingham, Patricia
Author_Institution :
Inst. of Canadian Res. Studies (ICURS), Simon Fraser Univ., Burnaby, BC, Canada
Abstract :
Crime Pattern Theory offers a theoretical framework for a micro level explanation of the dynamics of crime in an urban environment. The research focuses on the novel use the concept of boundaries or edges to analyze micro level differences in crime in various urban neighborhoods. Edges are identified where there is dissimilarity between adjacent areas. Crime is more likely to occur along edges. Edges can be physical, social, temporal and economical or a product of these dimensions. This study compares crime data from the Municipality of Burnaby in British Columbia, Canada with patterns in land use data. Single family residential neighborhoods are constructed by joining adjacently zoned single family areas. The edges of these neighborhoods are the areas where the single family zoning changes to commercial, parks and higher density residential zoning The results finds crime is sixty four percent higher in these edges than in the interior of the neighborhoods. The results are discussed and future research proposed to repeat and enhance the model.
Keywords :
data analysis; national security; pattern recognition; social sciences computing; British Columbia; Burnaby Municipality; Canada; commercial zoning; crime data; crime dynamics; crime pattern theory; crime-pattern recognition; edge effect; edge identification; high crime zones; higher density residential zoning; land use data patterns; parks; single family areas; single family residential neighborhoods; single family zoning; urban environment; urban neighborhoods; Cities and towns; Educational institutions; Geographic information systems; Image edge detection; Navigation; Roads; Urban areas; GIS techniques; crime analysis; crime-pattern recognition;
Conference_Titel :
Intelligence and Security Informatics (ISI), 2013 IEEE International Conference on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4673-6214-6
DOI :
10.1109/ISI.2013.6578828