Noise and local diagnostics of laser notches on silicon solar cells

The present paper deals with diagnostics of crystalline silicon solar cells with structures prepared by application of laser technologies. These laser-generated structures should help to isolate the edges of solar cells and also should isolate bulk defects. At the present we are trying to find the optimal parameters of laser processing. Laser parameters influencing how deep the laser notch is realized. We tried to determine what depth of the notch seems to be an ideal. Noise diagnostic methods are used for our study. These methods are based on the study of electrically measurable fluctuation quantities, especially electrical voltage and current, complemented by the transport characteristics. Electrical models describing behaviour of laser-prepared structures were put forward. The study of optical near-field and far-field will be also realized. Measurement of local radiation from solar cells during electrical excitation were carried out.