Generation-recombination noise, Allan variance, and low-frequency gain instabilities in microwave amplifiers

Author

Escotte, Laurent ; Gonneau, E.

Author_Institution

LAAS, Univ. of Toulouse, Toulouse, France

fYear

2013

fDate

24-28 June 2013

Firstpage

1

Lastpage

4

Abstract

The stability of a microwave amplifier is reported in this paper. The presence of a generation-recombination noise source is investigated both in the frequency and time domains. An analytical expression of the Allan variance in the case of Lorentzian noise is originally determined in the time domain and agrees with previous work. The model is supported by experimental data realized at different temperatures which corroborates the presence of a thermally activated process.

Keywords

frequency-domain analysis; low noise amplifiers; microwave amplifiers; stability; time-domain analysis; Allan variance; Lorentzian noise; frequency domains; generation-recombination noise; low-frequency gain instabilities; microwave amplifier stability; thermally activated process; time domains; Fluctuations; Microwave amplifiers; Microwave radiometry; Noise; Stability analysis; Temperature measurement; Thermal stability; Allan variance; Lorentzian noise; amplifiers; gain fluctuation; stability;

fLanguage

English

Publisher

ieee

Conference_Titel

Noise and Fluctuations (ICNF), 2013 22nd International Conference on

Conference_Location

Montpellier

Print_ISBN

978-1-4799-0668-0

Type

conf

DOI

10.1109/ICNF.2013.6579003

Filename

6579003