Low-frequency noise in type-II superlattice MWIR nBn detector

Author

Ciura, L. ; Kolek, Andrzej ; Zawislak, Z. ; Stadler, Adam W. ; Kowalewski, Adam ; Martyniuk, P. ; Wrobel, J. ; Rogalski, A. ; Gautam, Nishit ; Plis, Elena ; Krishna, Sanjay

Author_Institution

Dept. of Electron. Fundamentals, Rzeszow Univ. of Technol., Rzeszów, Poland

fYear

2013

fDate

24-28 June 2013

Firstpage

1

Lastpage

4

Abstract

The paper concerns low-frequency properties of mid-wavelength infrared type-II InAs/GaSb superlattice nBn detector. The current noise was directly measured in the range of 1-10⁴ Hz at 77 K and detectivity was determined in this frequency range and temperature. The common 1/f component found in the noise spectra was shown to originate from random processes occurring in surface imperfections that modulate both side-wall leakage and bulk currents.

Keywords

1/f noise; III-V semiconductors; gallium compounds; indium compounds; infrared detectors; random processes; semiconductor superlattices; 1/f noise component; InAs-GaSb; bulk current; current noise; frequency 1 Hz to 104 Hz; low frequency noise; midwavelength infrared superlattice nBn detector; random processes; sidewall leakage; surface imperfection; temperature 77 K; type-II superlattice MWIR nBn detector; Current measurement; Detectors; Frequency measurement; Noise; Noise measurement; Superlattices; Temperature measurement; 1/f noise; detectivity; infrared radiation; nBn detector; noise limitations;

fLanguage

English

Publisher

ieee

Conference_Titel

Noise and Fluctuations (ICNF), 2013 22nd International Conference on

Conference_Location

Montpellier

Print_ISBN

978-1-4799-0668-0

Type

conf

DOI

10.1109/ICNF.2013.6579013

Filename

6579013