DocumentCode
630226
Title
Table of contents
fYear
2013
fDate
7-7 June 2013
Firstpage
1
Lastpage
5
Abstract
The following topics are dealt with: microwave measurement system; and active device modeling.
Keywords
measurement systems; microwave measurement; active device modeling; microwave measurement system;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Measurement Conference (ARFTG), 2013 81st ARFTG
Conference_Location
Seattle, WA
Print_ISBN
978-1-4673-4981-9
Type
conf
DOI
10.1109/ARFTG.2013.6579019
Filename
6579019
Link To Document