• DocumentCode
    630227
  • Title

    Cross-connected waveguide lines as standards for millimeter- and submillimeter-wave vector network analyzers

  • Author

    Ridler, N.M. ; Salter, M.J.

  • Author_Institution
    National Physical Laboratory, Teddington, TW11 0LW, UK
  • fYear
    2013
  • fDate
    7-7 June 2013
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    This paper describes some investigations into establishing primary standards of loss for waveguide Vector Network Analyzers (VNAs) operating at millimeter- and submillimeter-wave frequencies. The standards comprise straight sections of waveguide, where the waveguide line is orientated such that the waveguide aperture is at right-angles to the waveguide apertures on the VNA test ports. This ´cross-connected´ waveguide forms a section of waveguide that is effectively below cut-off. The mechanical discontinuity between the cross-connected waveguide and the VNA test ports also generates significant reflection. The combined effect due to these two loss mechanisms - cut-off attenuation and discontinuity reflection loss - can be predicted from electromagnetic theory and so can be used to establish sections of cross-connected waveguide, of various lengths, as primary standards of loss. The paper describes these standards in detail and compares experimental results, obtained using a VNA operating in the 50 GHz to 75 GHz band, with values predicted by electromagnetic modeling software.
  • Keywords
    Apertures; Attenuation; Electromagnetic waveguides; Pins; Ports (Computers); Reflection; Standards; Attenuation measurement; Electromagnetic modeling; Measurement standards; Millimeter wave measurements; Submillimeter wave measurements; Waveguide junctions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurement Conference (ARFTG), 2013 81st ARFTG
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4673-4981-9
  • Type

    conf

  • DOI
    10.1109/ARFTG.2013.6579020
  • Filename
    6579020