Title :
Cross-connected waveguide lines as standards for millimeter- and submillimeter-wave vector network analyzers
Author :
Ridler, N.M. ; Salter, M.J.
Author_Institution :
National Physical Laboratory, Teddington, TW11 0LW, UK
Abstract :
This paper describes some investigations into establishing primary standards of loss for waveguide Vector Network Analyzers (VNAs) operating at millimeter- and submillimeter-wave frequencies. The standards comprise straight sections of waveguide, where the waveguide line is orientated such that the waveguide aperture is at right-angles to the waveguide apertures on the VNA test ports. This ´cross-connected´ waveguide forms a section of waveguide that is effectively below cut-off. The mechanical discontinuity between the cross-connected waveguide and the VNA test ports also generates significant reflection. The combined effect due to these two loss mechanisms - cut-off attenuation and discontinuity reflection loss - can be predicted from electromagnetic theory and so can be used to establish sections of cross-connected waveguide, of various lengths, as primary standards of loss. The paper describes these standards in detail and compares experimental results, obtained using a VNA operating in the 50 GHz to 75 GHz band, with values predicted by electromagnetic modeling software.
Keywords :
Apertures; Attenuation; Electromagnetic waveguides; Pins; Ports (Computers); Reflection; Standards; Attenuation measurement; Electromagnetic modeling; Measurement standards; Millimeter wave measurements; Submillimeter wave measurements; Waveguide junctions;
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2013 81st ARFTG
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4673-4981-9
DOI :
10.1109/ARFTG.2013.6579020