Edge-related calibration and measurement characteristics in pulsed profile S-parameter analysis

Pulsed profile S-parameter measurements have been performed for decades but as measurement hardware characteristics have changed (in terms of resolution, dynamic range and basic data acquisition); there may be gains to be made in re-examining calibration and measurement details. One candidate area is with pulsed stimulus measurements where edge-related performance is of interest and there are many choices with regard to modulator position, levels of correction of the modulation dynamics and correction indexing. By time-indexing error coefficients as well as raw S-parameter data, in a phase coherent fashion, some improvement in the corrected results near pulse edges seems possible in a number of cases when resolution is high.