DocumentCode :
630234
Title :
Figures of uncertainty for noise measurements
Author :
Seelmann-Eggebert, Matthias ; Baldischweiler, Boris ; Aja, B. ; Bruch, Daniel ; Massler, Hermann
Author_Institution :
Fraunhofer Inst. fur Angewandte Festkorperphys., Freiburg, Germany
fYear :
2013
fDate :
7-7 June 2013
Firstpage :
1
Lastpage :
4
Abstract :
In this paper we introduce two figures of uncertainty (FOU) for the assessment of noise figure measurements. These figures of uncertainty are readily determined if the scattering parameters of the device under test (DUT) are available. The two FOUs provide two types of information. On one hand side, they allow for a simple consistency check of the two measurements. On the other side, they give a measure for the accuracy and reliability of the noise figure, which in many cases may be limited due to second stage corrections. We suggest to include the two FOUs routinely as supplements for noise figure measurements.
Keywords :
electric noise measurement; measurement uncertainty; reliability; DUT; FOU; device under test; figures of uncertainty; noise figure measurement uncertainty assessment; reliability; Frequency measurement; Gain; Noise; Noise figure; Receivers; Uncertainty; deembedding; error analysis; low-noise transistor; microwave noise measurements; noise figure; noise parameters; uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2013 81st ARFTG
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4673-4981-9
Type :
conf
DOI :
10.1109/ARFTG.2013.6579033
Filename :
6579033
Link To Document :
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