• DocumentCode
    630234
  • Title

    Figures of uncertainty for noise measurements

  • Author

    Seelmann-Eggebert, Matthias ; Baldischweiler, Boris ; Aja, B. ; Bruch, Daniel ; Massler, Hermann

  • Author_Institution
    Fraunhofer Inst. fur Angewandte Festkorperphys., Freiburg, Germany
  • fYear
    2013
  • fDate
    7-7 June 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper we introduce two figures of uncertainty (FOU) for the assessment of noise figure measurements. These figures of uncertainty are readily determined if the scattering parameters of the device under test (DUT) are available. The two FOUs provide two types of information. On one hand side, they allow for a simple consistency check of the two measurements. On the other side, they give a measure for the accuracy and reliability of the noise figure, which in many cases may be limited due to second stage corrections. We suggest to include the two FOUs routinely as supplements for noise figure measurements.
  • Keywords
    electric noise measurement; measurement uncertainty; reliability; DUT; FOU; device under test; figures of uncertainty; noise figure measurement uncertainty assessment; reliability; Frequency measurement; Gain; Noise; Noise figure; Receivers; Uncertainty; deembedding; error analysis; low-noise transistor; microwave noise measurements; noise figure; noise parameters; uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurement Conference (ARFTG), 2013 81st ARFTG
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4673-4981-9
  • Type

    conf

  • DOI
    10.1109/ARFTG.2013.6579033
  • Filename
    6579033