DocumentCode
630237
Title
Experiment design for quick statistical FET large signal model extraction
Author
Angelov, Iltcho ; Ferndahl, Mattias ; Gavell, M. ; Avolio, Gustavo ; Schreurs, Dominique
Author_Institution
MEL, Chalmers Univ., Goteborg, Sweden
fYear
2013
fDate
7-7 June 2013
Firstpage
1
Lastpage
5
Abstract
Process variations influence the accuracy of designs and yield in production. This paper addresses the implementation of these variations in large signal FET models, with particular attention on the organization of measurements as to speed up the direct extraction of the model parameters.
Keywords
field effect transistors; semiconductor device models; statistical analysis; direct extraction; large signal FET models; model parameters; process variations; Capacitance; Field effect transistors; Frequency measurement; Gallium arsenide; Integrated circuit modeling; Solid modeling; Transmission line measurements; FET; Large Signal Models; Statistical Models;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Measurement Conference (ARFTG), 2013 81st ARFTG
Conference_Location
Seattle, WA
Print_ISBN
978-1-4673-4981-9
Type
conf
DOI
10.1109/ARFTG.2013.6579041
Filename
6579041
Link To Document