Title :
Fault-tolerance capabilities of a software-implemented Hopfield Neural Network
Author :
Mansour, Wassim ; Velazco, Raoul ; Ayoubi, Rafic ; El Falou, Wassim ; Ziade, Haissam
Author_Institution :
TIMA Labs., Grenoble, France
Abstract :
The associative Hopfield memory is a form of recurrent Artificial Neural Network (ANN) that can be used in applications such as pattern recognition, noise removal, information retrieval, and combinatorial optimization problems. In general, ANNs are considered as intrinsically fault-tolerant. A study of the capability of this algorithm to tolerate transient faults such as bit-flips provoked by the radiation environment is presented. Two software versions of the Hopfield Neural Network (HNN), one original and one fault-tolerant were implemented and executed by a LEON3 processor. Experimental results show the efficiency of the adopted strategy to tolerate faults that were injected at hardware level.
Keywords :
fault tolerant computing; recurrent neural nets; LEON3 processor; bit-flips; code emulated upset; combinatorial optimization problems; fault tolerance; information retrieval; noise removal; pattern recognition; recurrent artificial neural network; software implemented Hopfield neural network; transient faults; Artificial neural networks; Circuit faults; Fault tolerance; Fault tolerant systems; Hopfield neural networks; Neurons; Satellites; ANN; Code Emulated upset (CEU); HNN; fault-tolerance;
Conference_Titel :
Communications and Information Technology (ICCIT), 2013 Third International Conference on
Conference_Location :
Beirut
Print_ISBN :
978-1-4673-5306-9
DOI :
10.1109/ICCITechnology.2013.6579550