• DocumentCode
    630546
  • Title

    Using Fréchet sensitivity analysis to interrogate distributed parameters in random systems

  • Author

    Borggaard, Jeff ; Nunes, Vitor Leite ; van Wyk, Hans-Werner

  • Author_Institution
    Interdiscipl. Center for Appl. Math., Virginia Tech, Blacksburg, VA, USA
  • fYear
    2013
  • fDate
    17-19 June 2013
  • Firstpage
    491
  • Lastpage
    495
  • Abstract
    As simulation continues to replace experimentation in the design cycle, the need to quantify uncertainty in model outputs due to uncertainties in the model parameters becomes critical. While intelligent sampling methods such as sparse grid collocation has expanded the class of random systems that can be simulated to aid uncertainty quantification, the statistical characterization of the model parameters are rarely known. In previous works, we have proposed a number of methods for identification of the most significant parametric variations as well as an optimization-based framework for estimation of distributed parameters. This work combines these two approaches, we identify a stochastic parameter in a random system then use the Fréchet derivative to determine the most significant (deterministic, spatial) parametric variations. In other words, showing that the Fréchet derivative is Hilbert-Schmidt allows us to compute those parametric variations that have the most local impact on the solution. These variations are used to interrogate the stochastic parameter. We illustrate our methods with numerical example identifying the distributed stochastic parameter in an elliptic boundary value problem.
  • Keywords
    boundary-value problems; distributed parameter systems; parameter estimation; sampling methods; sensitivity analysis; uncertain systems; Fréchet derivative; Fréchet sensitivity analysis; Hilbert-Schmidt; design cycle; distributed parameters; distributed stochastic parameter identification; elliptic boundary value problem; intelligent sampling methods; model parameter statistical characterization; parametric variations; random systems; uncertainty quantification; Computational modeling; Partial differential equations; Sensitivity analysis; Stochastic processes; Uncertainty; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2013
  • Conference_Location
    Washington, DC
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4799-0177-7
  • Type

    conf

  • DOI
    10.1109/ACC.2013.6579885
  • Filename
    6579885