DocumentCode :
630946
Title :
Estimation of the shear force in Transverse Dynamic Force Microscopy using a sliding mode observer
Author :
Thang Nguyen ; Khan, Said G. ; Edwards, Chris ; Herrmann, Guido ; Picco, Loren ; Harniman, Robert ; Burgess, Stuart C. ; Antognozzi, Massimo ; Miles, Mervyn
Author_Institution :
Coll. of Eng., Math. & Phys. Sci., Univ. of Exeter, Exeter, UK
fYear :
2013
fDate :
17-19 June 2013
Firstpage :
5494
Lastpage :
5499
Abstract :
This paper concerns the application of a sliding mode observer to the problem of estimation of the shear force affecting the cantilever dynamics of a Transverse Dynamic Force Microscope (TDFM). The oscillated cantilever in proximity to a specimen permits the investigation of the specimen topography at nano-metre precision. The oscillation amplitude, but also in particular the shear forces, are a measure of distance to the specimen, and therefore the estimation of the shear force is of significance when attempting to construct TDFM images at submolecular accuracy. For estimation of the shear forces, an approximate model of the cantilever is derived using the method of lines. Model order reduction and sliding mode techniques are employed to reconstruct the unknown shear force affecting the cantilever dynamics based on only tip position measurements. Simulations are presented to illustrate the proposed scheme, which is to be implemented on the TDFM set up at the Centre for NSQI at Bristol.
Keywords :
cantilevers; force control; observers; oscillations; position measurement; reduced order systems; surface topography; variable structure systems; NSQI; TDFM images; TDFM set up; cantilever dynamics; model order reduction; nanometre precision; oscillated cantilever; oscillation amplitude; shear force estimation; shear forces; sliding mode observer; sliding mode techniques; specimen topography; submolecular accuracy; tip position measurements; transverse dynamic force microscope; transverse dynamic force microscopy; Dynamics; Force; Mathematical model; Microscopy; Observers; Probes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
American Control Conference (ACC), 2013
Conference_Location :
Washington, DC
ISSN :
0743-1619
Print_ISBN :
978-1-4799-0177-7
Type :
conf
DOI :
10.1109/ACC.2013.6580697
Filename :
6580697
Link To Document :
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