DocumentCode :
63219
Title :
Revealing Cascading Failure Vulnerability in Power Grids Using Risk-Graph
Author :
Yihai Zhu ; Jun Yan ; Yan Sun ; Haibo He
Author_Institution :
Dept. of Electr., Comput., & Biomed. Eng., Univ. of Rhode Island, Kingston, RI, USA
Volume :
25
Issue :
12
fYear :
2014
fDate :
Dec. 2014
Firstpage :
3274
Lastpage :
3284
Abstract :
Security issues related to power grid networks have attracted the attention of researchers in many fields. Recently, a new network model that combines complex network theories with power flow models was proposed. This model, referred to as the extended model, is suitable for investigating vulnerabilities in power grid networks. In this paper, we study cascading failures of power grids under the extended model. Particularly, we discover that attack strategies that select target nodes (TNs) based on load and degree do not yield the strongest attacks. Instead, we propose a novel metric, called the risk graph, and develop novel attack strategies that are much stronger than the load-based and degree-based attack strategies. The proposed approaches and the comparison approaches are tested on IEEE 57 and 118 bus systems and Polish transmission system. The results demonstrate that the proposed approaches can reveal the power grid vulnerability in terms of causing cascading failures more effectively than the comparison approaches.
Keywords :
IEEE standards; complex networks; load flow; power grids; power system security; power transmission reliability; risk analysis; IEEE 118 bus system; IEEE 57 bus system; Polish transmission system; TN; complex network; degree-based attack strategy; load-based attack strategy; power flow model; power grid failure; power grid network security; risk graph; target node; Complexity theory; Load modeling; Measurement; Niobium; Power grids; Power system faults; Power system protection; Power grid; attack; cascading failure; extended model; risk graph; security;
fLanguage :
English
Journal_Title :
Parallel and Distributed Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1045-9219
Type :
jour
DOI :
10.1109/TPDS.2013.2295814
Filename :
6714491
Link To Document :
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