• DocumentCode
    632820
  • Title

    Porous silicon prepared from p and p++ bulk silicon

  • Author

    Derek, V. ; Baltic, Romana ; Marcijus, Marijan ; Ristic, M. ; Orel, Zorica Crnjak ; Ivanda, M.

  • Author_Institution
    Div. of Mater. Phys., Ruder Boskovic Inst., Zagreb, Croatia
  • fYear
    2013
  • fDate
    20-24 May 2013
  • Firstpage
    18
  • Lastpage
    21
  • Abstract
    Macro and meso-porous silicon (PSi) samples were prepared by electrochemical anodisation of p- and p++ doped silicon wafers in hydrofluoric acid (HF) based electrolyte under galvanostatic conditions. Anodisation time and current were varied in order to obtain different PSi morphologies. Samples were characterized by scanning electron microscopy (SEM), photoluminescence (PL) spectroscopy and Raman spectroscopy. Samples prepared on p- type substrates were macro-porous, showed visible photoluminescence and no observable phonon confinement in Raman spectrum. Porous silicon prepared on p++ type substrates was mesoporous, showed no observable photoluminescence and intense phonon confinement was observed in their Raman spectra. Silicon nanocrystal dimensions in PSi samples obtained from photoluminescence and phonon confinement models were correlated with silicon electrochemical dissolution valence nd. A surface morphology instability is identified in case where electrolyte is more conductive than the silicon substrate.
  • Keywords
    Raman spectra; anodisation; dissolving; electrolytes; elemental semiconductors; mesoporous materials; phonons; photoluminescence; porous semiconductors; scanning electron microscopy; semiconductor growth; silicon; surface morphology; Raman spectroscopy; SEM; Si; electrochemical anodisation; electrochemical dissolution valence; galvanostatic conditions; hydrofluoric acid-based electrolyte; macroporous silicon; mesoporous silicon; nanocrystal dimensions; p++ type substrates; phonon confinement; photoluminescence; scanning electron microscopy; surface morphology instability; Morphology; Nanocrystals; Photoluminescence; Scanning electron microscopy; Silicon; Substrates; Surface morphology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information & Communication Technology Electronics & Microelectronics (MIPRO), 2013 36th International Convention on
  • Conference_Location
    Opatija
  • Print_ISBN
    978-953-233-076-2
  • Type

    conf

  • Filename
    6596217