• DocumentCode
    63334
  • Title

    Experimental results from droop compensation for the high voltage converter modulators

  • Author

    Patel, Gunjan P. ; Anderson, D.E. ; Peplov, Vladimir V. ; Saethre, Robert B. ; Solley, Dennis J. ; Wezensky, Mark W.

  • Author_Institution
    Spallation Neutron Source, Oak Ridge Nat. Lab., Oak Ridge, TN, USA
  • Volume
    20
  • Issue
    4
  • fYear
    2013
  • fDate
    Aug-13
  • Firstpage
    1093
  • Lastpage
    1100
  • Abstract
    The High Voltage Convertor Modulators are used to power the RF klystrons used throughout the linear accelerator at the Spallation Neutron Source. The output voltage of the modulator has significant voltage droop and ripple which, combined with low level RF system limitations, affect performance and stability of the accelerator cavities. In conjunction with the progress in the development of the new controller, different modulation techniques were implemented and studied on the test modulator rated at 75 kV, 125 A. This paper presents experimental results from implementation of frequency sweep, phase sweep and combined phase and frequency sweep modulation on the modulator output voltage pulse. Thermal measurements were carried out to determine the effect of these modulations schemes on long term reliability of the modulator. Future plans are also discussed.
  • Keywords
    high-voltage engineering; klystrons; linear accelerators; reliability; resonant power convertors; RF klystrons; Spallation neutron source; accelerator cavities; current 125 A; droop compensation; frequency sweep modulation; high voltage converter modulators; linear accelerator; phase sweep modulation; voltage 75 kV; voltage droop; Capacitors; Field programmable gate arrays; Frequency modulation; Insulated gate bipolar transistors; Phase modulation; Voltage control; Accelerators; insulated gate bipolar transistors; losses; pulse width modulation; reliability; resonant power conversion;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2013.6571422
  • Filename
    6571422